Open Access
December 2016 Improved transformation of ϕ-divergence goodness-of-fit test statistics based on minimum ϕ*-divergence estimator for GLIM of binary data
Nobuhiro Taneichi, Yuri Sekiya, Jun Toyama
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SUT J. Math. 52(2): 193-214 (December 2016). DOI: 10.55937/sut/1483720971

Abstract

Generalized linear models of binary data including a logistic regression model and a probit model are considered. For testing the null hypothesis that the considered model is correct, the ϕ-divergence family of goodness-of-fit test statistics Cϕϕ* that is based on a minimum ϕ*-divergence estimator is considered. The family of statistics Cϕϕ* includes a power divergence family of statistics Ra,b that is based on a minimum power divergence estimator. The derivation of an expression of a continuous term of asymptotic expansion for the distribution of Cϕϕ* under the null hypothesis is shown. Using the expression, a transformed Cϕϕ* statistic that improves the speed of convergence to the chi-square limiting distribution of Cϕϕ* is obtained. In the case of Ra,b, it is numerically shown that the transformed statistics usually perform better than the original statistics with respect to speed of convergence to the chi-square limiting distribution and it is also numerically shown that the power of the transformed statistics is almost the same as that of the original statistics.

Funding Statement

This research is partially supported by the Grants-in-aid for Scientific Research of Japan Society for the Promotion of Science (C) 24540133.

Citation

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Nobuhiro Taneichi. Yuri Sekiya. Jun Toyama. "Improved transformation of ϕ-divergence goodness-of-fit test statistics based on minimum ϕ*-divergence estimator for GLIM of binary data." SUT J. Math. 52 (2) 193 - 214, December 2016. https://doi.org/10.55937/sut/1483720971

Information

Received: 16 September 2016; Revised: 14 November 2016; Published: December 2016
First available in Project Euclid: 8 June 2022

Digital Object Identifier: 10.55937/sut/1483720971

Subjects:
Primary: 62E20 , 62H10

Keywords: Asymptotic expansion, binary data , generalized linear model , improved transformation , minimum ϕ*-divergence estimator , ϕ-divergence statistics

Rights: Copyright © 2016 Tokyo University of Science

Vol.52 • No. 2 • December 2016
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