VOL. 21 · NO. 4 | November 2006
 
VIEW ALL ABSTRACTS +
Frontmatter
Statist. Sci. 21 (4), (November 2006)
No abstract available
Statist. Sci. 21 (4), (November 2006)
No abstract available
Miscellaneous Items
Sallie Keller-McNulty, Alyson Wilson, Christine Anderson-Cook
Statist. Sci. 21 (4), 427, (November 2006) DOI: 10.1214/088342306000000664
No abstract available
Articles
Tim Bedford, John Quigley, Lesley Walls
Statist. Sci. 21 (4), 428-450, (November 2006) DOI: 10.1214/088342306000000510
KEYWORDS: Expert judgement, elicitation, reliability
Norman Fenton, Martin Neil
Statist. Sci. 21 (4), 451-453, (November 2006) DOI: 10.1214/088342306000000529
No abstract available
Andrew Koehler
Statist. Sci. 21 (4), 454-455, (November 2006) DOI: 10.1214/088342306000000538
No abstract available
Wenbin Wang
Statist. Sci. 21 (4), 456-459, (November 2006) DOI: 10.1214/088342306000000547
No abstract available
Tim Bedford, John Quigley, Lesley Walls
Statist. Sci. 21 (4), 460-462, (November 2006) DOI: 10.1214/088342306000000556
No abstract available
John M. Chambers, David A. James, Diane Lambert, Scott Vander Wiel
Statist. Sci. 21 (4), 463-475, (November 2006) DOI: 10.1214/088342306000000583
KEYWORDS: Aggregated data, data stream, Performance monitoring, reliability
Lorraine Denby, James M. Landwehr, Jean Meloche
Statist. Sci. 21 (4), 476-478, (November 2006) DOI: 10.1214/088342306000000619
No abstract available
Earl Lawrence, George Michailidis, Vijayan N. Nair
Statist. Sci. 21 (4), 479-482, (November 2006) DOI: 10.1214/088342306000000600
Bin Yu
Statist. Sci. 21 (4), 483-484, (November 2006) DOI: 10.1214/088342306000000628
No abstract available
John M. Chambers, David A. James, Diane Lambert, Scott Vander Wiel
Statist. Sci. 21 (4), 485-486, (November 2006) DOI: 10.1214/088342306000000592
No abstract available
Edsel A. Peña
Statist. Sci. 21 (4), 487-500, (November 2006) DOI: 10.1214/088342306000000349
KEYWORDS: counting process, hazard function, martingale, partial likelihood, generalized Nelson–Aalen estimator, generalized product-limit estimator
Mei-Ling Ting Lee, G. A. Whitmore
Statist. Sci. 21 (4), 501-513, (November 2006) DOI: 10.1214/088342306000000330
KEYWORDS: Accelerated testing, calendar time, Competing risk, cure rate, duration, environmental studies, First hitting time, gamma process, lifetime, latent variable models, maximum likelihood, operational time, occupational exposure, Ornstein–Uhlenbeck process, Poisson process, running time, stochastic process, stopping time, Survival analysis, threshold regression, time-to-event, Wiener diffusion process
Alyson G. Wilson, Todd L. Graves, Michael S. Hamada, C. Shane Reese
Statist. Sci. 21 (4), 514-531, (November 2006) DOI: 10.1214/088342306000000439
KEYWORDS: Bayesian, Bayesian network, Biased data, complex system, count data, degradation data, fault tree, flowgraph, Genetic algorithm, lifetime data, logistic regression, Markov chain Monte Carlo, Metropolis algorithm, multilevel data, nonhomogeneous Poisson process, prior elicitation, reliability block diagram, repairable system, resource allocation
Bo Henry Lindqvist
Statist. Sci. 21 (4), 532-551, (November 2006) DOI: 10.1214/088342306000000448
KEYWORDS: repairable system, preventive maintenance, nonhomogeneous Poisson process, Renewal process, marked point process, virtual age process, trend-renewal process, Heterogeneity, trend, competing risks
Luis A. Escobar, William Q. Meeker
Statist. Sci. 21 (4), 552-577, (November 2006) DOI: 10.1214/088342306000000321
KEYWORDS: reliability, regression model, lifetime data, degradation data, extrapolation, acceleration factor, Arrhenius relationship, Eyring relationship, inverse power relationship, voltage-stress acceleration, photodegradation
Paul Kvam
Statist. Sci. 21 (4), 578-585, (November 2006) DOI: 10.1214/088342306000000646
Back Matter
Statist. Sci. 21 (4), 586-588, (November 2006)
No abstract available
Back to Top