VOL. 14 · NO. 2 | 2020
 
VIEW ALL ABSTRACTS +
Articles
Emilio Porcu, Viktor Zastavnyi, Moreno Bevilacqua, Xavier Emery
Electron. J. Statist. 14 (2), 2510-2528, (2020) DOI: 10.1214/20-EJS1719
KEYWORDS: Compact support, covariance function, generalized Wendland, Matérn, screening effect, spatial prediction
Adriano Zanin Zambom, Yulia R. Gel
Electron. J. Statist. 14 (2), 2529-2550, (2020) DOI: 10.1214/20-EJS1722
KEYWORDS: Autoregressive conditional heteroscedastic models, exogenous variables, blockchain, nonlinear effects, ANOVA, goodness of fit, 62G08, 37M10, 91B84
Jing Zhou, Gerda Claeskens, Jelena Bradic
Electron. J. Statist. 14 (2), 2551-2599, (2020) DOI: 10.1214/20-EJS1728
KEYWORDS: mean squared error, $l_{1}$-regularization, approximate message passing, Quantile regression, 62J07, 62F12
Jan-Christian Hütter, Cheng Mao, Philippe Rigollet, Elina Robeva
Electron. J. Statist. 14 (2), 2600-2652, (2020) DOI: 10.1214/20-EJS1729
KEYWORDS: Totally positive distributions, Nonparametric density estimation, Shape-constrained estimation, 62G05, 62G07
Amir-Hossein Bateni, Arnak S. Dalalyan
Electron. J. Statist. 14 (2), 2653-2677, (2020) DOI: 10.1214/20-EJS1731
KEYWORDS: robust estimation, discrete models, Confidence regions, 62F35, 62H12
Isabelle S. Beaudry, Krista J. Gile
Electron. J. Statist. 14 (2), 2678-2713, (2020) DOI: 10.1214/20-EJS1718
KEYWORDS: Hard-to-reach population sampling, non-sampling errors, network sampling, social networks
Qifan Song
Electron. J. Statist. 14 (2), 2714-2741, (2020) DOI: 10.1214/20-EJS1732
KEYWORDS: shrinkage prior, Bayesian sharp minimax, heavy-tailed prior, adaptive prior
François Bachoc, Alexandra Suvorikova, David Ginsbourger, Jean-Michel Loubes, Vladimir Spokoiny
Electron. J. Statist. 14 (2), 2742-2772, (2020) DOI: 10.1214/20-EJS1725
KEYWORDS: kernel methods, Wasserstein distance, Hilbert space embeddings, 60G15
Kayvan Sadeghi
Electron. J. Statist. 14 (2), 2773-2797, (2020) DOI: 10.1214/20-EJS1730
KEYWORDS: Conditional independence, exchangeability, faithfulness, random networks
Abhishake Rastogi, Gilles Blanchard, Peter Mathé
Electron. J. Statist. 14 (2), 2798-2841, (2020) DOI: 10.1214/20-EJS1735
KEYWORDS: Statistical inverse problem, Tikhonov regularization, ‎reproducing kernel Hilbert ‎space, general source condition, Minimax convergence rates, 65J20, 62G08, 62G20, 65J15, 65J22
Lawrence Middleton, George Deligiannidis, Arnaud Doucet, Pierre E. Jacob
Electron. J. Statist. 14 (2), 2842-2891, (2020) DOI: 10.1214/20-EJS1727
Matteo Barigozzi, Haeran Cho
Electron. J. Statist. 14 (2), 2892-2921, (2020) DOI: 10.1214/20-EJS1741
KEYWORDS: factor models, Principal Component Analysis, sample eigenvectors, factor number, 62M10, 62H12
Emmanuelle Clément, Arnaud Gloter
Electron. J. Statist. 14 (2), 2922-2956, (2020) DOI: 10.1214/20-EJS1737
KEYWORDS: Lévy process, Stable process, Stochastic differential equation, Parametric inference, Estimating functions, 60G51, 60G52, 60J75, 62F12, 60H07, 60F05
Johanna Kappus, Friedrich Liese, Alexander Meister
Electron. J. Statist. 14 (2), 2957-2987, (2020) DOI: 10.1214/20-EJS1736
KEYWORDS: ‎asymptotic ‎equivalence, item response theory, Le Cam distance, Minimax optimality, statistical linear inverse problems, 62G07, 62G20, 62B15
Yuting Wei, Billy Fang, Martin J. Wainwright
Electron. J. Statist. 14 (2), 2988-3031, (2020) DOI: 10.1214/20-EJS1739
KEYWORDS: Complexity measure, ellipse constraint, Kolmogorov width, least squares, adaptive estimation, 62F10, 62F30, 62G08
Ted Westling, Mark J. van der Laan, Marco Carone
Electron. J. Statist. 14 (2), 3032-3069, (2020) DOI: 10.1214/20-EJS1740
KEYWORDS: Asymptotic linearity, Confidence band, kernel smoothing, projection, shape constraint, stochastic equicontinuity, 62G20, 60G15
Meimei Liu, Zuofeng Shang, Guang Cheng
Electron. J. Statist. 14 (2), 3070-3102, (2020) DOI: 10.1214/20-EJS1733
KEYWORDS: Computational limit, Divide and conquer, kernel ridge regression, Minimax optimality, Nonparametric testing, 62G08, 62G10
Axel Bücher, Tobias Jennessen
Electron. J. Statist. 14 (2), 3103-3156, (2020) DOI: 10.1214/20-EJS1734
Paul Doukhan, François Roueff, Joseph Rynkiewicz
Electron. J. Statist. 14 (2), 3157-3191, (2020) DOI: 10.1214/20-EJS1742
KEYWORDS: Trawl processes, integer-valued time series, long memory parameter estimation, 62M10, 62F12, 60K35
Hui Jiang, Hui Liu, Youzhou Zhou
Electron. J. Statist. 14 (2), 3192-3229, (2020) DOI: 10.1214/20-EJS1738
KEYWORDS: Ornstein-Uhlenbeck process, Discrete observations, Moderate deviation principle, multiple Wiener-Itô integrals, 62N02, 60F10, 60G22
Joshua Agterberg, Youngser Park, Jonathan Larson, Christopher White, Carey E. Priebe, Vince Lyzinski
Electron. J. Statist. 14 (2), 3230-3267, (2020) DOI: 10.1214/20-EJS1744
KEYWORDS: statistics, Random graphs, networks, adversarial machine learning, Vertex nomination, 62H99
Rebecca Killick, Marina I. Knight, Guy P. Nason, Idris A. Eckley
Electron. J. Statist. 14 (2), 3268-3314, (2020) DOI: 10.1214/20-EJS1748
KEYWORDS: locally stationary time series, integrated local wavelet periodogram, Wavelets, practical estimation, Haar cross-correlation wavelet
Benjamin Poignard, Yoshikazu Terada
Electron. J. Statist. 14 (2), 3315-3365, (2020) DOI: 10.1214/20-EJS1745
KEYWORDS: Approximate factor analysis, non-convex regulariser, statistical consistency, support recovery, 62H25, 62F99
Marta Catalano, Antonio Lijoi, Igor Prünster
Electron. J. Statist. 14 (2), 3366-3395, (2020) DOI: 10.1214/20-EJS1746
KEYWORDS: Bayesian nonparametrics, completely random measures, gamma random measure, kernel mixtures, posterior sampling, Survival analysis, Wasserstein distance
Bernhard Stankewitz
Electron. J. Statist. 14 (2), 3396-3428, (2020) DOI: 10.1214/20-EJS1747
KEYWORDS: linear inverse problems, spectral cut-off, early stopping, discrepancy principle, adaptive estimation, Oracle inequalities, weighed residuals, 65J20, 62G05
Yingjie Li, Liangliang Zhang, Tapabrata Maiti
Electron. J. Statist. 14 (2), 3429-3486, (2020) DOI: 10.1214/20-EJS1743
KEYWORDS: ‎classification‎, high dimensional, linear discriminant analysis, misclassification, neuroimaging, spatially dependent, tapered covariance, 62H30, 62H35
Rina Foygel Barber
Electron. J. Statist. 14 (2), 3487-3524, (2020) DOI: 10.1214/20-EJS1749
KEYWORDS: distribution-free, nonparametric inference, binary regression, adaptive inference, 62G08, 62G15, 62F35
Katerina Papagiannouli
Electron. J. Statist. 14 (2), 3525-3562, (2020) DOI: 10.1214/20-EJS1753
KEYWORDS: Co-jumps, Infinite variation, co-integrated volatility, high-frequency data, 60G51, 62G05, 62G10, 62C20, 60J75
Geoffrey Chinot
Electron. J. Statist. 14 (2), 3563-3605, (2020) DOI: 10.1214/20-EJS1754
KEYWORDS: regularized empirical risk minimizers, Outliers, robustness, minimax-rate-optimality, 62G35, 62G08
Jean-Marc Bardet, Abdellatif Guenaizi
Electron. J. Statist. 14 (2), 3606-3643, (2020) DOI: 10.1214/20-EJS1757
KEYWORDS: 62G05, 62G20, 62M05
Richard A. Davis, Mikkel S. Nielsen
Electron. J. Statist. 14 (2), 3644-3671, (2020) DOI: 10.1214/20-EJS1758
KEYWORDS: Markov processes, nonlinear autoregressive models, Nonparametric regression, random forests, 62G05, 60G10, 60J05, 62G08, 62M05, 62M10
Mahendra Mariadassou, Timothée Tabouy
Electron. J. Statist. 14 (2), 3672-3704, (2020) DOI: 10.1214/20-EJS1750
KEYWORDS: Stochastic block model, missing data, asymptotic normality, maximum likelihood, concentration inequality
Dan Cheng, Zhibing He, Armin Schwartzman
Electron. J. Statist. 14 (2), 3705-3729, (2020) DOI: 10.1214/20-EJS1751
KEYWORDS: Change points, FDR, power, Gaussian processes, kernel smoothing, Differential, multiple testing, local maxima, local minima, 62M10, 62M07, 60G35, 60G15
Ganggang Xu, Chong Zhao, Abdollah Jalilian, Rasmus Waagepetersen, Jingfei Zhang, Yongtao Guan
Electron. J. Statist. 14 (2), 3730-3765, (2020) DOI: 10.1214/20-EJS1755
KEYWORDS: Confidence band, estimating equations, local polynomial estimator, nonparametric estimation, orthogonal series estimator, replicated point patterns, 60K35, 60K35, 60K35
Tiantian Liu, Yair Goldberg
Electron. J. Statist. 14 (2), 3766-3820, (2020) DOI: 10.1214/20-EJS1752
KEYWORDS: Kernel machines, missing responses, inverse probability weighted estimator, doubly-robust estimator, Oracle inequality, consistency, learning rate, 60K35
Aviv Navon, Saharon Rosset
Electron. J. Statist. 14 (2), 3821-3844, (2020) DOI: 10.1214/20-EJS1764
KEYWORDS: covariance selection, EM algorithm, multivariate regression, penalized likelihood, regularization methods, sparse precision matrix
Young K. Lee, Enno Mammen, Jens P. Nielsen, Byeong U. Park
Electron. J. Statist. 14 (2), 3845-3868, (2020) DOI: 10.1214/20-EJS1760
KEYWORDS: regression function, bias, profiling technique, local linear estimation, cross-validatory bandwidth selectors, 62G08, 62G20
Deborah Kunkel, Mario Peruggia
Electron. J. Statist. 14 (2), 3869-3913, (2020) DOI: 10.1214/20-EJS1756
KEYWORDS: label switching, data-dependent prior, Identifiability, EM algorithm
Koji Tsukuda, Yoichi Nishiyama
Electron. J. Statist. 14 (2), 3914-3938, (2020) DOI: 10.1214/20-EJS1761
KEYWORDS: diffusion process, nonlinear time series, Goodness-of-fit test, weak convergence in Hilbert space, 62M02, 60F05, 60F17, 60G42, 62G10
Stanislav Nagy, Rainer Dyckerhoff, Pavlo Mozharovskyi
Electron. J. Statist. 14 (2), 3939-3975, (2020) DOI: 10.1214/20-EJS1759
KEYWORDS: approximation, depth, halfspace depth, projection depth, Tukey depth, 62G20, 62H12
Satya Prakash Singh, Ori Davidov
Electron. J. Statist. 14 (2), 3976-4003, (2020) DOI: 10.1214/20-EJS1763
KEYWORDS: ANOVA, Bayesian design, maxi-min design, Nash equilibrium, power, 62K05
Art B. Owen, Hal Varian
Electron. J. Statist. 14 (2), 4004-4027, (2020) DOI: 10.1214/20-EJS1765
KEYWORDS: electronic commerce, Experimental design, hybrid experiments, 62K99, 62J99, 62F99
Wenpin Tang, Yuting Ye
Electron. J. Statist. 14 (2), 4028-4053, (2020) DOI: 10.1214/20-EJS1766
KEYWORDS: elliptical distribution, generalized linear models, maximum likelihood estimate, phase transition
Li-Pang Chen, Grace Y. Yi
Electron. J. Statist. 14 (2), 4054-4109, (2020) DOI: 10.1214/20-EJS1762
KEYWORDS: Focus information criterion, Left-truncation, measurement error, model averaging, Model selection, Survival analysis
Stefano Peluso, Guido Consonni
Electron. J. Statist. 14 (2), 4110-4132, (2020) DOI: 10.1214/20-EJS1768
KEYWORDS: DAG-Wishart prior, graphical models, Markov equivalence class, structural learning, 62F15, 62H22
Si Peng, Xiaotong Shen, Wei Pan
Electron. J. Statist. 14 (2), 4133-4164, (2020) DOI: 10.1214/20-EJS1767
KEYWORDS: Causal relations, Constrained likelihood, intervention, reconstruction identifiability, 62-09
Fabian Mies
Electron. J. Statist. 14 (2), 4165-4206, (2020) DOI: 10.1214/20-EJS1769
KEYWORDS: high-frequency, method of moments, jump activity, Fisher information, non-diagonal rate matrix, 62M05, 60G51
Abdelhadi Akharif, Mohamed Fihri, Marc Hallin, Amal Mellouk
Electron. J. Statist. 14 (2), 4207-4243, (2020) DOI: 10.1214/20-EJS1770
KEYWORDS: Aligned rank test, cone-shaped alternative, local asymptotic normality, multiple regression model, pseudo-Gaussian test, random coefficient, unidentified nuisance, testing for homogeneity, Mixture models, 62J05, 62G10, 62F03
Sebastian Döhler, Etienne Roquain
Electron. J. Statist. 14 (2), 4244-4272, (2020) DOI: 10.1214/20-EJS1771
KEYWORDS: false discovery exceedance, heterogeneous data, discrete hypothesis testing, weighted $p$-values, type I error rate control, step-down algorithm, 62H15, 62Q05
Bruno Ebner, Franz Nestmann, Matthias Schulte
Electron. J. Statist. 14 (2), 4273-4320, (2020) DOI: 10.1214/20-EJS1776
KEYWORDS: Multivariate goodness-of-fit test, uniform distribution, Random geometric graph, Gilbert graph, $U$-statistics, contiguous alternatives, 62G10, 62G20, 60D05
Sebastian Kühnert
Electron. J. Statist. 14 (2), 4321-4360, (2020) DOI: 10.1214/20-EJS1778
KEYWORDS: ARCH, ARMA, functional data, functional principal components, functional time series, GARCH, invertible linear processes, parameter estimation; stationary solutions, Yule-Walker equation, 47B38, 60G10, 62F12
Michael P. Casey
Electron. J. Statist. 14 (2), 4361-4394, (2020) DOI: 10.1214/20-EJS1773
KEYWORDS: Dimension reduction, embeddings of finite metric spaces, random projection, metric preserving function, Cauchy random variables, Cauchy projections, Stable distributions, concentration of measure, 60, 46B09, 46B85, 60E07, 60G50
Gabriela Ciołek, Dmytro Marushkevych, Mark Podolskij
Electron. J. Statist. 14 (2), 4395-4420, (2020) DOI: 10.1214/20-EJS1775
KEYWORDS: Dantzig estimator, high dimensional statistics, Lasso, Ornstein-Uhlenbeck process, Parametric estimation, 62M05, 60G15, 62H12, 62M99
Aboubacrène Ag Ahmad, El Hadji Deme, Aliou Diop, Stéphane Girard, Antoine Usseglio-Carleve
Electron. J. Statist. 14 (2), 4421-4456, (2020) DOI: 10.1214/20-EJS1779
KEYWORDS: semi-parametric estimation, regression and dispersion functions, Tail-index, extreme conditional quantile, 62G32, 62G30, 62E20
Haoxin Zhuang, Liqun Diao, Grace Y. Yi
Electron. J. Statist. 14 (2), 4457-4488, (2020) DOI: 10.1214/20-EJS1784
KEYWORDS: Bayesian hierarchical model, copula, dependence modeling, MCMC
Boyan Duan, Aaditya Ramdas, Sivaraman Balakrishnan, Larry Wasserman
Electron. J. Statist. 14 (2), 4489-4551, (2020) DOI: 10.1214/20-EJS1790
KEYWORDS: Interactive testing, global null, data carving, 60G10, 62M07
Back to Top