VOL. 14 · NO. 1 | 2020
 
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Articles
Ben Jones, Andreas Artemiou, Bing Li
Electron. J. Statist. 14 (1), 1-23, (2020) DOI: 10.1214/19-EJS1655
KEYWORDS: Cauchy distribution, Dimension reduction, Nonparametric regression, kernel principal components, unitary invariance, 60K35, 60K35, 60K35
Alexandre Mösching, Lutz Dümbgen
Electron. J. Statist. 14 (1), 24-49, (2020) DOI: 10.1214/19-EJS1659
KEYWORDS: regression quantiles, stochastic order, uniform consistency, 62G08, 62G20, 62G30
Gwenaëlle Castellan, Anthony Cousien, Viet Chi Tran
Electron. J. Statist. 14 (1), 50-81, (2020) DOI: 10.1214/19-EJS1627
KEYWORDS: Sensitivity analysis in a stochastic framework, Sobol indices of order 1, adaptive non-parametric inference, warped wavelets, Model selection, applications to Epidemiology, SIR model, spread of the Hepatitis Virus C among drug users, 49Q12, 62G08, 62P10
Wenjing Wang, Xin Zhang, Qing Mai
Electron. J. Statist. 14 (1), 82-109, (2020) DOI: 10.1214/19-EJS1652
KEYWORDS: clustering, computational statistics, Dimension reduction, envelope methods, Gaussian mixture models
Sihai Dave Zhao, Yet Tien Nguyen
Electron. J. Statist. 14 (1), 110-142, (2020) DOI: 10.1214/19-EJS1663
KEYWORDS: False discovery rate, replicability, multiple testing, simultaneous signals
Tuo Chen, Zhihua Su, Yi Yang, Shanshan Ding
Electron. J. Statist. 14 (1), 143-173, (2020) DOI: 10.1214/19-EJS1664
KEYWORDS: sufficient dimension reduction, envelope model, expectile regression, generalized method of moments
David Azriel, Armin Schwartzman
Electron. J. Statist. 14 (1), 174-206, (2020) DOI: 10.1214/19-EJS1656
KEYWORDS: high-dimensional regression, linear projections, 62J05, 60K35, 62P10
Patrick L. Combettes, Christian L. Müller
Electron. J. Statist. 14 (1), 207-238, (2020) DOI: 10.1214/19-EJS1662
KEYWORDS: Convex optimization, heteroscedastic model, concomitant M-estimator, perspective function, proximal algorithm, robust regression, 90C25, 62J02, 46N30, 62P10
Gianluca Finocchio, Johannes Schmidt-Hieber
Electron. J. Statist. 14 (1), 239-271, (2020) DOI: 10.1214/19-EJS1671
KEYWORDS: frequentist Bayes, maximum likelihood, semiparametric inference, Gaussian sequence model, Bernstein-von Mises theorems
Assaf Rabinowicz, Saharon Rosset
Electron. J. Statist. 14 (1), 272-301, (2020) DOI: 10.1214/19-EJS1666
KEYWORDS: model assessment, Model selection, $AIC$, expected optimism, linear mixed models, kriging
Wanli Qiao
Electron. J. Statist. 14 (1), 302-344, (2020) DOI: 10.1214/19-EJS1668
KEYWORDS: Level set, optimal bandwidth, kernel density estimation, symmetric difference, 62G20, 62G05
Arvind Prasadan, Raj Rao Nadakuditi, Debashis Paul
Electron. J. Statist. 14 (1), 345-385, (2020) DOI: 10.1214/19-EJS1657
KEYWORDS: sparse PCA, random matrices, FDR, sparsistency, 65F50, 62H25, 62H15, 62F03, 60G35, 15A18‎
Olivier Roustant, Fabrice Gamboa, Bertrand Iooss
Electron. J. Statist. 14 (1), 386-412, (2020) DOI: 10.1214/19-EJS1673
KEYWORDS: chaos expansion, Sobol-Hoeffding decomposition, Sobol indices, derivative-based global sensitivity measures, Poincaré inequality, 65C60, 26D10, 62P30
Ming Yu, Varun Gupta, Mladen Kolar
Electron. J. Statist. 14 (1), 413-457, (2020) DOI: 10.1214/19-EJS1658
KEYWORDS: nonconvex optimization, low rank and two-way sparse coefficient matrix, gradient descent with hard thresholding, multi-task learning, two-way sparse reduce rank regression, 90C26
Anatoli Juditsky, Arkadi Nemirovski
Electron. J. Statist. 14 (1), 458-502, (2020) DOI: 10.1214/19-EJS1661
KEYWORDS: Functional estimation, statistical linear inverse problems, nonlinear estimation, sketching, 62J05, 62H12, 62G08
François Bachoc, Baptiste Broto, Fabrice Gamboa, Jean-Michel Loubes
Electron. J. Statist. 14 (1), 503-546, (2020) DOI: 10.1214/19-EJS1674
KEYWORDS: learning, Gaussian processes, covariance functions, statistical ranking, partial rankings, 60G15, 62M20
Gregor Pasemann, Wilhelm Stannat
Electron. J. Statist. 14 (1), 547-579, (2020) DOI: 10.1214/19-EJS1665
KEYWORDS: Parametric drift estimation, robustness, semilinear stochastic partial differential equations, maximum likelihood estimation, Fitzhugh–Nagumo system
Emanuel Ben-David, Bala Rajaratnam
Electron. J. Statist. 14 (1), 580-604, (2020) DOI: 10.1214/19-EJS1669
KEYWORDS: graphical models, Wishart distribution, Gaussian distribution, 62-09, 60E05, 62F99
Maddalena Cavicchioli
Electron. J. Statist. 14 (1), 605-631, (2020) DOI: 10.1214/19-EJS1672
KEYWORDS: Stationary vector stochastic processes, spectral density matrix, Wold coefficients, generalised spectrum models, Box-Cox link, spectral estimation, Whittle likelihood, 62M10, 62M15, 62H12
Ruofei Zhao, Yuanzhi Li, Yuekai Sun
Electron. J. Statist. 14 (1), 632-660, (2020) DOI: 10.1214/19-EJS1660
KEYWORDS: EM algorithm, Gaussian mixture models, 62F10, 65K05
Laurent Gardes
Electron. J. Statist. 14 (1), 661-701, (2020) DOI: 10.1214/20-EJS1678
KEYWORDS: Extreme conditional quantiles, Confidence interval, Dimension reduction
Ery Arias-Castro, Rong Huang, Nicolas Verzelen
Electron. J. Statist. 14 (1), 702-730, (2020) DOI: 10.1214/19-EJS1675
KEYWORDS: rare effects, Positive dependence, higher criticism, Gaussian mixture Copula model, rank tests
Cheryl Flynn, Patrick Perry
Electron. J. Statist. 14 (1), 731-768, (2020) DOI: 10.1214/19-EJS1667
KEYWORDS: Biclustering, block model, profile likelihood, congressional voting, microarray data, 62-07, 62G20
Benjamin Colling, Ingrid Van Keilegom
Electron. J. Statist. 14 (1), 769-800, (2020) DOI: 10.1214/20-EJS1676
KEYWORDS: asymptotic properties, estimation, $L_{2}$-distance minimization, parametric transformation, semiparametric regression
Ran Dai, Hyebin Song, Rina Foygel Barber, Garvesh Raskutti
Electron. J. Statist. 14 (1), 801-834, (2020) DOI: 10.1214/20-EJS1677
KEYWORDS: isotonic regression, bias, 62G08
Alessandro Casa, José E. Chacón, Giovanna Menardi
Electron. J. Statist. 14 (1), 835-856, (2020) DOI: 10.1214/20-EJS1679
KEYWORDS: nonparametric clustering, Kernel estimator, mean shift clustering, plug-in bandwidth, gradient bandwidth, 62G20, 62H30, 62G07
Daniel Rudolf, Björn Sprungk
Electron. J. Statist. 14 (1), 857-889, (2020) DOI: 10.1214/20-EJS1680
KEYWORDS: Metropolis–Hastings algorithm, importance sampling, Markov chains, variance reduction, central limit theorem, 62-04, 60J05, 60J22, 60F05, 62F15
Emilio Porcu, Rachid Senoussi, Enner Mendoza, Moreno Bevilacqua
Electron. J. Statist. 14 (1), 890-916, (2020) DOI: 10.1214/19-EJS1670
KEYWORDS: covariance function, nonstationarity, reducibility problem, spheres
Mario Teixeira Parente, Jonas Wallin, Barbara Wohlmuth
Electron. J. Statist. 14 (1), 917-943, (2020) DOI: 10.1214/20-EJS1684
KEYWORDS: Dimension reduction, Active subspaces, Poincaré inequalities, 60D05, 65C50, 65C60
Karl Ewald, Ulrike Schneider
Electron. J. Statist. 14 (1), 944-969, (2020) DOI: 10.1214/20-EJS1687
KEYWORDS: Lasso, distribution, Model selection, uniqueness, 62E15, 62J05, 62J07
Xianzheng Huang, Haiming Zhou
Electron. J. Statist. 14 (1), 970-1023, (2020) DOI: 10.1214/20-EJS1688
KEYWORDS: bandwidth, bias, Cross validation, deconvoluting kernel, 62G08, 62G20
Christophe A. N. Biscio, Nicolas Chenavier, Christian Hirsch, Anne Marie Svane
Electron. J. Statist. 14 (1), 1024-1074, (2020) DOI: 10.1214/20-EJS1683
KEYWORDS: Point processes, Goodness-of-fit tests, central limit theorem, topological data analysis, persistent Betti number, 60D05, 55N20, 60F17
Fabien Panloup, Samy Tindel, Maylis Varvenne
Electron. J. Statist. 14 (1), 1075-1136, (2020) DOI: 10.1214/20-EJS1685
KEYWORDS: fractional Brownian motion, parameter drift estimation, ergodicity, 62M09, 62F12
Tomáš Rubín, Victor M. Panaretos
Electron. J. Statist. 14 (1), 1137-1210, (2020) DOI: 10.1214/20-EJS1690
KEYWORDS: autocovariance operator, confidence bands, Functional data analysis, Nonparametric regression, spectral density operator, 62M10, 62M15, 60G10
Anja Janßen, Phyllis Wan
Electron. J. Statist. 14 (1), 1211-1233, (2020) DOI: 10.1214/20-EJS1689
KEYWORDS: Dimension reduction, Extreme value statistics, $k$-means clustering, spectral measure, 62G32, 62H30, 60G70
Vincent Brault, Christine Keribin, Mahendra Mariadassou
Electron. J. Statist. 14 (1), 1234-1268, (2020) DOI: 10.1214/20-EJS1695
KEYWORDS: Latent Block Model, asymptotic normality, maximum likelihood estimate, concentration inequality
Yichong Wu, Tiejun Li, Xiaoping Liu, Luonan Chen
Electron. J. Statist. 14 (1), 1269-1301, (2020) DOI: 10.1214/20-EJS1691
KEYWORDS: Differential network, Gaussian assumption, fused D-trace loss, cross variables, Coordinate descent, 62P10, 92B15, 65K10
Zhixin Zhou, Ping Li
Electron. J. Statist. 14 (1), 1302-1347, (2020) DOI: 10.1214/20-EJS1686
KEYWORDS: Chernoff information, Bayes error probability, Hypothesis testing, Community detection, stochastic block models, 62F03, 60G05
Rahul Mazumder, Haolei Weng
Electron. J. Statist. 14 (1), 1348-1385, (2020) DOI: 10.1214/20-EJS1681
KEYWORDS: Degrees of freedom, divergence, low rank, matrix valued function, regularization, spectral function, SURE, 62H12
Ryoya Oda, Hirokazu Yanagihara
Electron. J. Statist. 14 (1), 1386-1412, (2020) DOI: 10.1214/20-EJS1701
KEYWORDS: consistency, high-dimensional asymptotic framework, multivariate linear regression, Variable selection, 62J05, 62E20
Xuening Zhu
Electron. J. Statist. 14 (1), 1413-1448, (2020) DOI: 10.1214/20-EJS1693
KEYWORDS: High dimensional time series, nonconcave penalization, vector autoregression, dependent data, 62M10, 62J07, 62F12, 62H12
Claudia Wehrhahn, Samuel Leonard, Abel Rodriguez, Tatiana Xifara
Electron. J. Statist. 14 (1), 1449-1478, (2020) DOI: 10.1214/20-EJS1696
KEYWORDS: Disease clustering, Areal data, Chinese restaurant process
María F. Gil–Leyva, Ramsés H. Mena, Theodoros Nicoleris
Electron. J. Statist. 14 (1), 1479-1507, (2020) DOI: 10.1214/20-EJS1694
KEYWORDS: Beta-Binomial Markov chain, Density estimation, Dirichlet process prior, geometric process prior, stick-breaking prior
Kentaro Minami
Electron. J. Statist. 14 (1), 1508-1576, (2020) DOI: 10.1214/20-EJS1700
KEYWORDS: Piecewise monotone function, isotonic regression, nearly-isotonic regression, adaptive risk bounds
Yuling Yan, Bret Hanlon, Sebastien Roch, Karl Rohe
Electron. J. Statist. 14 (1), 1577-1610, (2020) DOI: 10.1214/20-EJS1698
KEYWORDS: limit distribution, Galton-Watson process, Volz-Heckathorn estimator, 62D05, 60J20
Annalisa Fabretti, Samantha Leorato
Electron. J. Statist. 14 (1), 1611-1647, (2020) DOI: 10.1214/20-EJS1697
KEYWORDS: quantiles, random probability measures, M-quantiles, 60G57, 62G07
Aurélie Fischer, Dominique Picard
Electron. J. Statist. 14 (1), 1648-1689, (2020) DOI: 10.1214/20-EJS1692
KEYWORDS: Change-point estimation, maximum likelihood, Minimax rate, Dimension reduction, Lepski’s method, 62H30, 62G05
Guanyang Wang
Electron. J. Statist. 14 (1), 1690-1706, (2020) DOI: 10.1214/20-EJS1702
KEYWORDS: MCMC, uniform sampling, binary matrix, Fixed margins, 62D05, 62P25
Wei Li, Subhashis Ghosal
Electron. J. Statist. 14 (1), 1707-1743, (2020) DOI: 10.1214/20-EJS1705
KEYWORDS: Filament, Nonparametric regression, posterior contraction, credibility, coverage, B-splines, 62G08, 62G20, 62G15
Daniel R. Kowal, Antonio Canale
Electron. J. Statist. 14 (1), 1744-1772, (2020) DOI: 10.1214/20-EJS1707
KEYWORDS: Additive models, BART, count data, Nonparametric regression, prediction, 62F15, 62G08, 62M20
Mikael Escobar-Bach, Yuri Goegebeur, Armelle Guillou
Electron. J. Statist. 14 (1), 1773-1795, (2020) DOI: 10.1214/20-EJS1706
KEYWORDS: bias correction, conditional stable tail dependence function, Stochastic convergence, 62G32, 62G05, 62G20, 60F05, 60G70
Matthias Löwe, Kristina Schubert
Electron. J. Statist. 14 (1), 1796-1815, (2020) DOI: 10.1214/20-EJS1703
KEYWORDS: Block models, Ising model, Curie-Weiss model, Fluctuations, Critical temperature
Heiko Werner, Hajo Holzmann, Pierre Vandekerkhove
Electron. J. Statist. 14 (1), 1816-1871, (2020) DOI: 10.1214/20-EJS1699
KEYWORDS: adaptive estimation, M-estimation, switching regression, semiparametric mixture, uniform rates of convergence
Tamara Fernández, Nicolás Rivera
Electron. J. Statist. 14 (1), 1872-1916, (2020) DOI: 10.1214/20-EJS1704
KEYWORDS: Kaplan-Meier estimator, right-censoring, V-statistics, 62N02, 62G20, 62G30
Daren Wang, Yi Yu, Alessandro Rinaldo
Electron. J. Statist. 14 (1), 1917-1961, (2020) DOI: 10.1214/20-EJS1710
KEYWORDS: change point detection, Minimax optimality, $\ell _{0}$-penalization, CUSUM statistics, binary segmentation
François Bachoc, José Betancourt, Reinhard Furrer, Thierry Klein
Electron. J. Statist. 14 (1), 1962-2008, (2020) DOI: 10.1214/20-EJS1712
KEYWORDS: Covariance parameters, asymptotic normality, consistency, Weak dependence, Random fields, increasing-domain asymptotics, 62M30, 62F12
Jean-Marc Bardet, Kare Kamila, William Kengne
Electron. J. Statist. 14 (1), 2009-2052, (2020) DOI: 10.1214/20-EJS1709
KEYWORDS: Model selection, affine causal processes, consistency, BIC, Portmanteau test, 60K35, 60K35, 60K35
Eunji Lim
Electron. J. Statist. 14 (1), 2053-2097, (2020) DOI: 10.1214/20-EJS1714
KEYWORDS: isotonic regression, convex regression, model misspecification, consistency, Convergence rates, tests for misspecification, 62G08, 62G20, 62G10
Emmanuel Gobet, Uladzislau Stazhynski
Electron. J. Statist. 14 (1), 2098-2122, (2020) DOI: 10.1214/20-EJS1708
KEYWORDS: Diffusion coefficient estimation, observation at stopping times, consistent sequence of estimators, local asymptotic mixed normality, asymptotic variance, optimal lower bound, 62Mxx, 62Fxx, 60F05, 60G40, 60GXX, 62F12
Christine Cutting, Davy Paindaveine, Thomas Verdebout
Electron. J. Statist. 14 (1), 2123-2154, (2020) DOI: 10.1214/20-EJS1716
KEYWORDS: axial data, contiguity, directional statistics, local asymptotic normality, rotational symmetry, tests of uniformity, 62H11, 62F05, 62E20
Juho Piironen, Markus Paasiniemi, Aki Vehtari
Electron. J. Statist. 14 (1), 2155-2197, (2020) DOI: 10.1214/20-EJS1711
KEYWORDS: projection, prediction, Feature selection, Sparsity, Post-selection inference, 62F15, 62F07, 62J12
Karine Bertin, Nicolas Klutchnikoff, Jose R. Léon, Clémentine Prieur
Electron. J. Statist. 14 (1), 2198-2237, (2020) DOI: 10.1214/20-EJS1682
KEYWORDS: Compact supported density estimation, Multivariate analysis, mixing stochastic processes, 62G07, 60G10, 60K35
Maria Mohr, Natalie Neumeyer
Electron. J. Statist. 14 (1), 2238-2271, (2020) DOI: 10.1214/20-EJS1715
KEYWORDS: bootstrap, change point detection, cumulative sums, distribution-free test, Heteroscedasticity, Kernel estimation, Nonparametric regression, sequential empirical process, 62M10, 62G08, 62G09, 62G10
Wenhua Jiang
Electron. J. Statist. 14 (1), 2272-2297, (2020) DOI: 10.1214/20-EJS1717
KEYWORDS: Empirical Bayes, Heteroscedasticity, generalized MLE, adaptive minimaxity, 62C12, 62G05, 62G20
Sai Li
Electron. J. Statist. 14 (1), 2298-2337, (2020) DOI: 10.1214/20-EJS1713
KEYWORDS: confidence intervals, high-dimensional models, debiased Lasso
Luc Devroye, Abbas Mehrabian, Tommy Reddad
Electron. J. Statist. 14 (1), 2338-2361, (2020) DOI: 10.1214/20-EJS1721
KEYWORDS: Density estimation, distribution learning, Graphical model, Markov random field, Ising model, multivariate normal, Fano’s lemma, 62G07, 82B20
Gongkai Li, Minh Tang, Nicolas Charon, Carey Priebe
Electron. J. Statist. 14 (1), 2362-2394, (2020) DOI: 10.1214/20-EJS1720
KEYWORDS: Classical multidimensional scaling, dissimilarity matrix, Perturbation analysis, central limit theorem, 62H12, 62H30, 62B10
Li Cai, Lei Jin, Suojin Wang
Electron. J. Statist. 14 (1), 2395-2438, (2020) DOI: 10.1214/20-EJS1723
KEYWORDS: local linear smoothing, longitudinal data, oracle efficiency, partially linear single-index model, simultaneous confidence band
Yuhao Wang, Santiago Segarra, Caroline Uhler
Electron. J. Statist. 14 (1), 2439-2483, (2020) DOI: 10.1214/20-EJS1724
KEYWORDS: Causal inference, linear structural equation model, High-dimensional statistics, Graphical model, 62F12, 62F30
Puying Zhao, J. N. K. Rao, Changbao Wu
Electron. J. Statist. 14 (1), 2484-2509, (2020) DOI: 10.1214/20-EJS1726
KEYWORDS: Auxiliary information, bootstrap, calibration weighting, design-based inference, estimating equations, hypothesis test, replication weights, survey design, Variable selection, 62D05, 62G05, 62G10
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