VOL. 12 · NO. 1 | 2018
 
VIEW ALL ABSTRACTS +
Articles
Yang Cao, Arkadi Nemirovski, Yao Xie, Vincent Guigues, Anatoli Juditsky
Electron. J. Statist. 12 (1), 1-57, (2018) DOI: 10.1214/17-EJS1373
KEYWORDS: change-point detection, semi-definite program, 62C20, 90C22
Claudio Fuentes, George Casella, Martin T. Wells
Electron. J. Statist. 12 (1), 58-79, (2018) DOI: 10.1214/17-EJS1374
KEYWORDS: confidence intervals, selected means, selected populations, asymmetric intervals, simultaneous inference, frequentist estimation
Oleg V. Chernoyarov, Yury A. Kutoyants, Andrei P. Trifonov
Electron. J. Statist. 12 (1), 80-106, (2018) DOI: 10.1214/17-EJS1385
KEYWORDS: misspecification, change-point type model, maximum likelihood estimator, regularity conditions, 62M02, 62G10, 62G20
Anne van Delft, Michael Eichler
Electron. J. Statist. 12 (1), 107-170, (2018) DOI: 10.1214/17-EJS1384
KEYWORDS: Functional data analysis, Locally stationary processes, spectral analysis, Kernel estimator, 62M10, 62M15
Xiaolu Zhu, Annie Qu
Electron. J. Statist. 12 (1), 171-193, (2018) DOI: 10.1214/17-EJS1389
KEYWORDS: ADMM, longitudinal data, minimax concave penalty, Model selection, nonparametric spline method
Bogdan Ćmiel, Zbigniew Szkutnik, Jakub Wojdyła
Electron. J. Statist. 12 (1), 194-223, (2018) DOI: 10.1214/18-EJS1391
KEYWORDS: Spektor-Lord-Willis problem, inverse problem, minimax risk, rate of convergence, derivative estimation, Kernel estimator, confidence bands, Adaptive estimator, 62G05, 62G20, 45Q05
Mofei Jia, Emanuele Taufer, Maria Michela Dickson
Electron. J. Statist. 12 (1), 224-248, (2018) DOI: 10.1214/18-EJS1394
KEYWORDS: tail index, heavy-tailed distributions, regular variation, Empirical characteristic function, Zipf’s law, 62G32, 62J05
Susan Wei, Victor M. Panaretos
Electron. J. Statist. 12 (1), 249-276, (2018) DOI: 10.1214/17-EJS1382
KEYWORDS: Diffusion tensor imaging, gradient line, heat flow, integral curve, local principal curve, scale space, vector field
Eric Gautier, Erwan Le Pennec
Electron. J. Statist. 12 (1), 277-320, (2018) DOI: 10.1214/17-EJS1383
KEYWORDS: Discrete choice models, random coefficients, Inverse problems, minimax rate optimality, Adaptation, Needlets, data-driven thresholding, 62P20, 42C15, 62C20, 62G07, 62G08, 62G20
David Steinsaltz, Andrew Dahl, Kenneth W. Wachter
Electron. J. Statist. 12 (1), 321-358, (2018) DOI: 10.1214/17-EJS1386
KEYWORDS: heritability, random-effects models, random matrices, Marčenko–Pastur distribution, GCTA, 92D10, 62P10, 62F10, 60B20
Jonathan El Methni, Laurent Gardes, Stéphane Girard
Electron. J. Statist. 12 (1), 359-398, (2018) DOI: 10.1214/18-EJS1392
KEYWORDS: Conditional tail moment, Kernel estimator, asymptotic normality, risk measures, extreme-value index, extreme-value analysis, 62G32, 62G30, 62E20
Jorge Clarke De la Cerda, Alfredo Alegría, Emilio Porcu
Electron. J. Statist. 12 (1), 399-426, (2018) DOI: 10.1214/18-EJS1393
KEYWORDS: Gaussian random fields, global data, big data, space-time covariance, Karhunen-Loève expansion, spherical harmonics functions, Schoenberg’s functions, 60G60, 60G17, 41A25, 60G15, 33C55, 46E35, 33C45
Federico Camerlenghi, Elena Villa
Electron. J. Statist. 12 (1), 427-460, (2018) DOI: 10.1214/18-EJS1397
KEYWORDS: large deviations, Moderate deviations, random closed sets, confidence intervals, Stochastic geometry, Boolean models, 62F12, 60F10, 60D05
Sébastien Gadat, Fabien Panloup, Sofiane Saadane
Electron. J. Statist. 12 (1), 461-529, (2018) DOI: 10.1214/18-EJS1395
KEYWORDS: Stochastic optimization algorithms, second-order methods, Random dynamical systems, 60J70, 35H10, 60G15, 35P15
Harish G. Ramaswamy, Ambuj Tewari, Shivani Agarwal
Electron. J. Statist. 12 (1), 530-554, (2018) DOI: 10.1214/17-EJS1388
KEYWORDS: machine learning, ‎classification‎, statistical consistency, surrogate loss, Calibration, abstain loss, 62H30, 68T10
Tristan Benoist, Fabrice Gamboa, Clément Pellegrini
Electron. J. Statist. 12 (1), 555-571, (2018) DOI: 10.1214/18-EJS1396
F. J. Rubio, M. F. J. Steel
Electron. J. Statist. 12 (1), 572-598, (2018) DOI: 10.1214/18-EJS1401
KEYWORDS: Bayesian inference, heavy tails, MEAFT models, posterior propriety, skewness, stochastic frontier models, 62F15, 62J05, 62N01
Zhu Wang
Electron. J. Statist. 12 (1), 599-650, (2018) DOI: 10.1214/18-EJS1404
KEYWORDS: Robust method, machine learning, boosting, difference of convex, MM algorithm, 62H30, 62G35, 68Q32, 90C26
Alisa Kirichenko, Harry van Zanten
Electron. J. Statist. 12 (1), 651-666, (2018) DOI: 10.1214/18-EJS1407
KEYWORDS: Function estimation on graphs, minimax lower bounds
Kashif Yousuf
Electron. J. Statist. 12 (1), 667-702, (2018) DOI: 10.1214/18-EJS1402
KEYWORDS: High-dimensional statistics, Sparsity, Lasso, time series, functional dependence measure, Variable selection, Nagaev inequality, sure independence screening, 62F07, 62J07
Elisabeth Gassiat, Judith Rousseau, Elodie Vernet
Electron. J. Statist. 12 (1), 703-740, (2018) DOI: 10.1214/17-EJS1387
KEYWORDS: semiparametric statistics, Mixture models, efficiency, Bernstein von Mises theorem, 62G05, 62G20
Alexis Derumigny
Electron. J. Statist. 12 (1), 741-766, (2018) DOI: 10.1214/18-EJS1410
KEYWORDS: sparse linear regression, Minimax rates, High-dimensional statistics, Adaptivity, square-root estimators, 62G08, 62C20, 62G05
Adriano Zanin Zambom, Michael G. Akritas
Electron. J. Statist. 12 (1), 767-792, (2018) DOI: 10.1214/18-EJS1405
KEYWORDS: ANOVA, False discovery rate, lack-of-fit test, multiple testing, Nonparametric regression
Ingrid Blaschzyk, Ingo Steinwart
Electron. J. Statist. 12 (1), 793-823, (2018) DOI: 10.1214/18-EJS1406
KEYWORDS: Statistical learning, ‎classification‎, excess risk, fast rates of convergence, histogram rule, 62H30, 62G20, 68T05
Seonjin Kim, Hyunkeun Ryan Cho
Electron. J. Statist. 12 (1), 824-850, (2018) DOI: 10.1214/18-EJS1409
KEYWORDS: empirical likelihood, kernel smoothing, Quantile regression, quadratic inference function, semiparametric regression, 62G08
Nicolas Brosse, Alain Durmus, Éric Moulines
Electron. J. Statist. 12 (1), 851-889, (2018) DOI: 10.1214/18-EJS1411
KEYWORDS: Normalizing constants, Bayes factor, annealed importance sampling, Unadjusted Langevin Algorithm, 65C05, 60F25, 62L10, 65C40, 60J05, 74G10, 74G15
Annabel Prause, Ansgar Steland
Electron. J. Statist. 12 (1), 890-940, (2018) DOI: 10.1214/18-EJS1398
KEYWORDS: Data science, High-dimensional data, imaging, long-run variance estimation, threshold estimator, subsampling, spatial statistics, testing, 62H86, 62E20, 60G60, 62H12
Rongning Wu, Yunwei Cui
Electron. J. Statist. 12 (1), 941-959, (2018) DOI: 10.1214/18-EJS1390
KEYWORDS: asymptotics, autoregressive process, estimation, financial data, infinite variance, 62M10, 62F12
Praneeth Vepakomma, Chetan Tonde, Ahmed Elgammal
Electron. J. Statist. 12 (1), 960-984, (2018) DOI: 10.1214/18-EJS1403
KEYWORDS: Distance correlation, multivariate statistical independence, minorization maximization, supervised dimensionality reduction, fixed point iteration, optimization, representation learning
Tito Manrique, Christophe Crambes, Nadine Hilgert
Electron. J. Statist. 12 (1), 985-1018, (2018) DOI: 10.1214/18-EJS1412
KEYWORDS: functional linear model, functional data, Ridge regression, concurrent model, varying coefficient model, 62J05, 62G05, 62G20, 62J07
Francisco Blasques, Paolo Gorgi, Siem Jan Koopman, Olivier Wintenberger
Electron. J. Statist. 12 (1), 1019-1052, (2018) DOI: 10.1214/18-EJS1416
KEYWORDS: consistency, invertibility, maximum likelihood estimation, observation-driven models, stochastic recurrence equations, 62M86, 62M20
Sangwon Hyun, Max G’Sell, Ryan J. Tibshirani
Electron. J. Statist. 12 (1), 1053-1097, (2018) DOI: 10.1214/17-EJS1363
KEYWORDS: generalized lasso, Fused lasso, Trend filtering, Post-selection inference, 62F03, 62G15
Axel Bücher, Johan Segers
Electron. J. Statist. 12 (1), 1098-1125, (2018) DOI: 10.1214/18-EJS1415
KEYWORDS: Apéry’s constant, Block maxima, Fréchet distribution, maximum likelihood estimator, Marshall–Olkin distribution, Pickands dependence function, return level, 62G32, 62M10
Ramji Venkataramanan, Oliver Johnson
Electron. J. Statist. 12 (1), 1126-1149, (2018) DOI: 10.1214/18-EJS1419
KEYWORDS: minimax lower bounds, Fano’s inequality, compressed sensing, Density estimation, Active learning, 62G05, 62B10, 62G07
Eric F. Lock, Gen Li
Electron. J. Statist. 12 (1), 1150-1180, (2018) DOI: 10.1214/18-EJS1421
KEYWORDS: Faces in the wild, Dimension reduction, latent variables, parafac/candecomp, Singular value decomposition, tensors
Zhou Shen, Michael Levine, Zuofeng Shang
Electron. J. Statist. 12 (1), 1181-1209, (2018) DOI: 10.1214/18-EJS1417
KEYWORDS: Penalized smoothed likelihood, MM algorithm, regularization, 62G07, 62G99
Achmad Choiruddin, Jean-François Coeurjolly, Frédérique Letué
Electron. J. Statist. 12 (1), 1210-1255, (2018) DOI: 10.1214/18-EJS1408
KEYWORDS: Campbell theorem, estimating function, Feature selection, logistic regression likelihood, penalized regression, Poisson likelihood, 62H11, 60G55, 62J07, 65C60, 97K80
Cristina Butucea, Jean-François Delmas, Anne Dutfoy, Richard Fischer
Electron. J. Statist. 12 (1), 1256-1298, (2018) DOI: 10.1214/18-EJS1413
KEYWORDS: Adaptive density estimation, Aggregation, exponential family, Kullback-Leibler divergence, product form, Sobolev classes, truncation model, 62G07, 62G05, 62G20
Ting Yan, Liangqiang Qu, Zhaohai Li, Ao Yuan
Electron. J. Statist. 12 (1), 1299-1329, (2018) DOI: 10.1214/18-EJS1423
KEYWORDS: Conditional kernel, density estimate, incomplete data model, NPMLE
Alan Riva Palacio, Fabrizio Leisen
Electron. J. Statist. 12 (1), 1330-1357, (2018) DOI: 10.1214/18-EJS1420
KEYWORDS: Bayesian nonparametrics, Survival analysis, Dependent completely random measures, 62F15, 60G57, 60G51
Karl Ewald, Ulrike Schneider
Electron. J. Statist. 12 (1), 1358-1387, (2018) DOI: 10.1214/18-EJS1425
KEYWORDS: Sparsity, confidence region, valid inference, 62F25, 62J05, 62J07
Teresa M. Lebair, Jinglai Shen
Electron. J. Statist. 12 (1), 1388-1428, (2018) DOI: 10.1214/18-EJS1426
KEYWORDS: asymptotic analysis, B-splines, Convergence rates, $k$-monotone estimation, Nonparametric regression, shape constraints, 62G08, 62G20
Po-Ling Loh, Xin Lu Tan
Electron. J. Statist. 12 (1), 1429-1467, (2018) DOI: 10.1214/18-EJS1427
KEYWORDS: Robust covariance matrix estimation, cellwise contamination, Kendall’s tau, Spearman’s rho, median absolute deviation, 62F35, 62G35
Xuehu Zhu, Lixing Zhu
Electron. J. Statist. 12 (1), 1468-1506, (2018) DOI: 10.1214/18-EJS1414
KEYWORDS: Significance testing, sufficient dimension reduction, ridge-type eigenvalue ratio, 62G10, 62H15, 62H10
Dmitry Babichev, Francis Bach
Electron. J. Statist. 12 (1), 1507-1543, (2018) DOI: 10.1214/18-EJS1428
KEYWORDS: multi-index model, Dimension reduction, non-linear regression, slice inverse regression, 62J02, 62G20, 62G05
Matteo Fasiolo, Simon N. Wood, Florian Hartig, Mark V. Bravington
Electron. J. Statist. 12 (1), 1544-1578, (2018) DOI: 10.1214/18-EJS1433
KEYWORDS: intractable likelihood, saddlepoint approximation, synthetic likelihood, simulation-based inference, implicit statistical model, Density estimation
Claudia Kirch, Silke Weber
Electron. J. Statist. 12 (1), 1579-1613, (2018) DOI: 10.1214/18-EJS1431
KEYWORDS: Change point analysis, sequential test, online monitoring, regression, integer-valued time series, 62L10, 62G10, 62M10
Alessandro De Gregorio, Stefano Maria Iacus
Electron. J. Statist. 12 (1), 1614-1630, (2018) DOI: 10.1214/18-EJS1436
KEYWORDS: dynamical systems, lasso estimation, Model selection, Inference for stochastic processes, diffusion-type processes, oracle properties, 62M05, 62J07, 62F12
Matthew R. Williams, Terrance D. Savitsky
Electron. J. Statist. 12 (1), 1631-1661, (2018) DOI: 10.1214/18-EJS1435
KEYWORDS: survey sampling, sampling weights, Quantile regression, non-linear regression, Markov chain Monte Carlo
Anna Bonnet
Electron. J. Statist. 12 (1), 1662-1716, (2018) DOI: 10.1214/18-EJS1424
KEYWORDS: Case-control studies, heritability, high dimension, mixed models
Oscar-Hernan Madrid-Padilla, Nicholas G. Polson, James Scott
Electron. J. Statist. 12 (1), 1717-1751, (2018) DOI: 10.1214/18-EJS1430
KEYWORDS: Deconvolution, Mixture models, penalized likelihood, Empirical Bayes, sensitivity analysis, 62G05, 62G07
Luc Devroye, László Györfi, Gábor Lugosi, Harro Walk
Electron. J. Statist. 12 (1), 1752-1778, (2018) DOI: 10.1214/18-EJS1438
KEYWORDS: Regression functional, Nearest-neighbor-based estimate, asymptotic normality, Concentration inequalities, Dimension reduction, 62G08, 62G20
Gilles Blanchard, Clayton Scott
Electron. J. Statist. 12 (1), 1779-1781, (2018) DOI: 10.1214/18-EJS1422
Liang Liang, Raymond Carroll, Yanyuan Ma
Electron. J. Statist. 12 (1), 1782-1821, (2018) DOI: 10.1214/18-EJS1446
KEYWORDS: Biased samples, case-control study, Dimension reduction, heteroscedastic error, secondary analysis, Semiparametric estimation, 62G05
Felix Abramovich, Daniela De Canditiis, Marianna Pensky
Electron. J. Statist. 12 (1), 1822-1841, (2018) DOI: 10.1214/18-EJS1447
KEYWORDS: Aggregation, ill-posed linear inverse problem, Model selection, Oracle inequality, overcomplete dictionary, 62G05, 62C10
Chong Chen, Ruibin Xi, Nan Lin
Electron. J. Statist. 12 (1), 1842-1866, (2018) DOI: 10.1214/18-EJS1445
KEYWORDS: consistency, degree corrected stochastic block model, spectral clustering, outlier, Social network, gene regulatory network, 62-09, 62P10
Sebastian Döhler, Guillermo Durand, Etienne Roquain
Electron. J. Statist. 12 (1), 1867-1900, (2018) DOI: 10.1214/18-EJS1441
KEYWORDS: False discovery rate, heterogeneous data, discrete hypothesis testing, type I error rate control, Adaptive procedure, step-up algorithm, step-down algorithm, 62H15, 62Q05
John A.D. Aston, Claudia Kirch
Electron. J. Statist. 12 (1), 1901-1947, (2018) DOI: 10.1214/18-EJS1442
KEYWORDS: CUSUM, high dimensional efficiency, model misspecification, panel data, projections, 62F05, 62M10, 62G10
Igor Silin, Vladimir Spokoiny
Electron. J. Statist. 12 (1), 1948-1987, (2018) DOI: 10.1214/18-EJS1451
KEYWORDS: Covariance matrix, spectral projector, Principal Component Analysis, Bernstein–von Mises theorem, 62F15, 62H25, 62G20, 62F25
Yang Liu, Peng Wang
Electron. J. Statist. 12 (1), 1988-2017, (2018) DOI: 10.1214/18-EJS1434
KEYWORDS: penalized likelihood, Lasso, variable/feature selection, solution paths, AIC/BIC, cross-validation, tuning, 62F07, 62J07, 62J86
Markus Bibinger, Lars Winkelmann
Electron. J. Statist. 12 (1), 2018-2073, (2018) DOI: 10.1214/18-EJS1444
KEYWORDS: high-frequency data, microstructure noise, nonparametric volatility estimation, volatility jumps, 62G10, 62M10
X. Jessie Jeng, Wenbin Lu, Huimin Peng
Electron. J. Statist. 12 (1), 2074-2089, (2018) DOI: 10.1214/18-EJS1439
KEYWORDS: Large $p$ small $n$, model misspecification, Optimal treatment regime, robust regression, 62J05, 62F35, 62P10
Back to Top