On the Wiener process approximation to Bayesian sequential testing problems

VOL. 6.1 | 1972 On the Wiener process approximation to Bayesian sequential testing problems

Chapter Author(s) P. J. Bickel, J. A. Yahav

Editor(s) Lucien M. Le Cam, Jerzy Neyman, Elizabeth L. Scott

Berkeley Symp. on Math. Statist. and Prob., 1972: 57-83 (1972)

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Vol. 6.1 • 1 January 1972

University of California Press

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