VOL. 23 · NO. 2 | May 2008
Statist. Sci. 23 (2), (May 2008)
No abstract available
Statist. Sci. 23 (2), (May 2008)
No abstract available
Persi Diaconis, Kshitij Khare, Laurent Saloff-Coste
Statist. Sci. 23 (2), 151-178, (May 2008) DOI: 10.1214/07-STS252
KEYWORDS: Gibbs sampler, running time analyses, exponential families, conjugate priors, location families, orthogonal polynomials, Singular value decomposition
Patrizia Berti, Guido Consonni, Luca Pratelli, Pietro Rigo
Statist. Sci. 23 (2), 179-182, (May 2008) DOI: 10.1214/08-STS252D
No abstract available
Galin L. Jones, Alicia A. Johnson
Statist. Sci. 23 (2), 183-186, (May 2008) DOI: 10.1214/08-STS252C
No abstract available
Gérard Letac
Statist. Sci. 23 (2), 187-191, (May 2008) DOI: 10.1214/08-STS252A
No abstract available
Richard A. Levine, George Casella
Statist. Sci. 23 (2), 192-195, (May 2008) DOI: 10.1214/08-STS252B
No abstract available
Persi Diaconis, Kshitij Khare, Laurent Saloff-Coste
Statist. Sci. 23 (2), 196-200, (May 2008) DOI: 10.1214/08-STS252REJ
Geert Verbeke, Geert Molenberghs, Caroline Beunckens
Statist. Sci. 23 (2), 201-218, (May 2008) DOI: 10.1214/07-STS253
KEYWORDS: Interval of ignorance, linear mixed model, missing at random, missing not at random, multivariate normal, sensitivity analysis
Ben B. Hansen, Jake Bowers
Statist. Sci. 23 (2), 219-236, (May 2008) DOI: 10.1214/08-STS254
KEYWORDS: cluster, contiguity, community intervention, group randomization, Randomization inference, subclassification
David A. Freedman
Statist. Sci. 23 (2), 237-249, (May 2008) DOI: 10.1214/08-STS262
KEYWORDS: models, Randomization, logistic regression, logit, average predicted probability
James M. Flegal, Murali Haran, Galin L. Jones
Statist. Sci. 23 (2), 250-260, (May 2008) DOI: 10.1214/08-STS257
KEYWORDS: Convergence diagnostic, Markov chain, Monte Carlo, standard errors
Stephen M. Stigler
Statist. Sci. 23 (2), 261-271, (May 2008) DOI: 10.1214/08-STS256
KEYWORDS: karl Pearson, R. A. Fisher, Chi-square test, Degrees of freedom, Parametric inference, History of statistics
Myles Hollander
Statist. Sci. 23 (2), 272-285, (May 2008) DOI: 10.1214/07-STS237
KEYWORDS: Bayes risk efficiency, Dirichlet process, image analysis, large deviations, Moderate deviations, nonparametric Bayes methods, reliability
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