Open Access
2023 Sieve estimation of semiparametric accelerated mean models with panel count data
Xiangbin Hu, Wen Su, Xingqiu Zhao
Author Affiliations +
Electron. J. Statist. 17(1): 1316-1343 (2023). DOI: 10.1214/23-EJS2128

Abstract

A widely adopted semiparametric model for analyzing panel count data is a proportional mean model, which may be deemed inappropriate when the proportionality assumption is violated. Motivated by the popular accelerated failure time model that relaxes such assumption, we investigate accelerated mean models for semiparametric regression analysis of panel count data. For estimation of bundled parameters, we develop a sieve least squares estimation procedure, which is robust in the sense that no distributional assumption is required for the underlying recurrent event process. Overcoming the theoretical challenges from bundled parameters, we establish the consistency and convergence rate of the proposed estimators, and derive the asymptotic normality of both the finite-dimensional estimator and the functionals of the infinite-dimensional estimator. Simulation studies demonstrate promising performances of the proposed approach, and an application to a skin cancer chemoprevention trial yields some new findings.

Funding Statement

This research was supported in part by the Research Grant Council of Hong Kong (15306521) and the National Natural Science Foundation of China (12271459).

Acknowledgments

The authors would like to thank the Editor, the Associate Editor and the two reviewers for their constructive and insightful comments and suggestions that greatly improved the paper.

Citation

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Xiangbin Hu. Wen Su. Xingqiu Zhao. "Sieve estimation of semiparametric accelerated mean models with panel count data." Electron. J. Statist. 17 (1) 1316 - 1343, 2023. https://doi.org/10.1214/23-EJS2128

Information

Received: 1 January 2022; Published: 2023
First available in Project Euclid: 18 April 2023

MathSciNet: MR4577266
zbMATH: 07690324
Digital Object Identifier: 10.1214/23-EJS2128

Subjects:
Primary: 62N01 , 62N02
Secondary: 62F12

Keywords: Accelerated mean model , counting process , empirical process , panel count data , sieve least squares estimation

Vol.17 • No. 1 • 2023
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