VOL. 15 · NO. 2 | 2021
Minwoo Chae, Pierpaolo De Blasi, Stephen G. Walker
Electron. J. Statist. 15 (2), 3635-3677, (2021) DOI: 10.1214/21-EJS1869
KEYWORDS: Dirichlet process mixture, nonparametric Bayesian inference, posterior consistency, posterior convergence rate, Wasserstein metrics, 62F15, 62G20, 62G07
Wei Hu, Danyang Huang, Bingyi Jing, Bo Zhang
Electron. J. Statist. 15 (2), 3678-3707, (2021) DOI: 10.1214/21-EJS1872
KEYWORDS: Large-scale network, multivariate spatial autoregression model, subsampling, least-squares estimation
Eni Musta, Ingrid Van Keilegom
Electron. J. Statist. 15 (2), 3708-3742, (2021) DOI: 10.1214/21-EJS1874
KEYWORDS: cure models, logistic model, measurement error, simex algorithm, Survival analysis, 62N02
Arash A. Amini
Electron. J. Statist. 15 (2), 3743-3761, (2021) DOI: 10.1214/21-EJS1873
KEYWORDS: kernel methods, Ridge regression, spectral truncation, Nonparametric regression, minimax estimation, 62G08, 62G20, 62C20
Florian Heinrichs, Holger Dette
Electron. J. Statist. 15 (2), 3762-3797, (2021) DOI: 10.1214/21-EJS1871
KEYWORDS: Change point analysis, local stationary processes, Nonparametric regression
Dong Xia
Electron. J. Statist. 15 (2), 3798-3851, (2021) DOI: 10.1214/21-EJS1876
KEYWORDS: Singular value decomposition, projection distance, Normal approximation, Random matrix theory, spectral perturbation, 62H10, 62H25, 62G20
Christian Gouriéroux, Yang Lu
Electron. J. Statist. 15 (2), 3852-3891, (2021) DOI: 10.1214/21-EJS1875
KEYWORDS: Time reversibility bubble, Noncausal process, Discrete stable distribution, infinite server queue, 62M10, 60K25
Anas Barakat, Pascal Bianchi, Walid Hachem, Sholom Schechtman
Electron. J. Statist. 15 (2), 3892-3947, (2021) DOI: 10.1214/21-EJS1880
KEYWORDS: stochastic approximation, dynamical systems, adaptive gradient methods with momentum, Nesterov accelerated gradient, ADAM, avoidance of traps, 62L20, 34A12, 68T99, 60F99
Jessie Hendricks, Cedric Neumann, Christopher P. Saunders
Electron. J. Statist. 15 (2), 3948-3950, (2021) DOI: 10.1214/21-EJS1886
KEYWORDS: Approximate Bayesian Computation, Bayes factor, correction, Forensic science, fingerprint, weight of evidence, receiver operating characteristic
Philippe Gagnon
Electron. J. Statist. 15 (2), 3951-3995, (2021) DOI: 10.1214/21-EJS1877
KEYWORDS: Bayesian statistics, large-sample asymptotics, Markov chain Monte Carlo methods, model averaging, Model selection, trans-dimensional samplers, Variable selection, weak convergence
Shuhao Jiao, Hernando Ombao
Electron. J. Statist. 15 (2), 3996-4026, (2021) DOI: 10.1214/21-EJS1882
KEYWORDS: Functional registration, functional time series, (spherical)K-means clustering, nonlinear dimension reduction, prediction, Shape space, state-space model, 62R10, 37M10
Victoria P. Johnson
Electron. J. Statist. 15 (2), 4027-4060, (2021) DOI: 10.1214/21-EJS1866
KEYWORDS: Block randomization, permuted block design, maximum tolerated imbalance, truncated binomial design, maximal procedure, 62K10, 62E15, 62L05
Yaqing Chen, Hans-Georg Müller
Electron. J. Statist. 15 (2), 4061-4084, (2021) DOI: 10.1214/21-EJS1883
KEYWORDS: Time-varying density functions, Wasserstein metric, dynamics of income distributions, evolution of human mortality, 62G05, 62G20
Denis Allard, Dionisios T. Hristopulos, Thomas Opitz
Electron. J. Statist. 15 (2), 4085-4116, (2021) DOI: 10.1214/21-EJS1879
KEYWORDS: Besag process, estimation, Leroux process, prediction, regularization, spatial covariance, 60K35, 62H11, 62M30, 62P12, 62P35
Pierre Monmarché
Electron. J. Statist. 15 (2), 4117-4166, (2021) DOI: 10.1214/21-EJS1888
KEYWORDS: Markov chain Monte Carlo, Langevin diffusion, Wasserstein curvature, Hamiltonian Monte Carlo, 65C05
Wenxing Guo, Narayanaswamy Balakrishnan, Mengjie Bian
Electron. J. Statist. 15 (2), 4167-4191, (2021) DOI: 10.1214/21-EJS1895
KEYWORDS: ‎matrix projection, reduced rank regression, Dimension reduction, High-dimensional data, multivariate linear regression model, 62F30, 62H12, 62J99
Yi Zhao, Brian Caffo, Xi Luo
Electron. J. Statist. 15 (2), 4192-4235, (2021) DOI: 10.1214/21-EJS1887
KEYWORDS: covariance matrix estimation, generalized linear regression, Heteroscedasticity, shrinkage estimator, 62J99, 62H99
David Rossell, Piotr Zwiernik
Electron. J. Statist. 15 (2), 4236-4263, (2021) DOI: 10.1214/21-EJS1891
KEYWORDS: 62H05, 62H20, 62H22, Partial correlation graph, elliptical distribution, transelliptical distribution, graphical models, multivariate total positivity
Yan Cui, Michael Levine, Zhou Zhou
Electron. J. Statist. 15 (2), 4264-4294, (2021) DOI: 10.1214/21-EJS1893
KEYWORDS: Change points, Gaussian approximation, local stationarity, simultaneous confidence bands
Marcin Mider, Moritz Schauer, Frank van der Meulen
Electron. J. Statist. 15 (2), 4295-4342, (2021) DOI: 10.1214/21-EJS1894
KEYWORDS: Chemical reaction network, data assimilation, diffusion bridge, Filtering, guided proposal, Lorenz system, Markov chain Monte Carlo, partial observations, stochastic heat equation on a graph, 60J60, 65C05, 62F15
Bilel Bousselmi, Jean-François Dupuy, Abderrazek Karoui
Electron. J. Statist. 15 (2), 4343-4383, (2021) DOI: 10.1214/21-EJS1897
KEYWORDS: Poisson regression, asymptotic properties, missing data, regression calibration, multiple imputation, Augmented inverse probability weighting, simulations, 62J12, 62F12
Kyoungjae Lee, Lizhen Lin, David Dunson
Electron. J. Statist. 15 (2), 4384-4419, (2021) DOI: 10.1214/21-EJS1900
KEYWORDS: Bayesian hypothesis test, covariance structure testing, modularization
Linquan Ma, Lan Liu, Wei Yang
Electron. J. Statist. 15 (2), 4420-4461, (2021) DOI: 10.1214/21-EJS1881
KEYWORDS: Efficiency gain, EM-algorithm, envelope model, missing data, multivariate regression
Johannes Krebs, Benjamin Roycraft, Wolfgang Polonik
Electron. J. Statist. 15 (2), 4462-4509, (2021) DOI: 10.1214/21-EJS1898
KEYWORDS: Binomial process, bootstrap, Čech complex, critical regime, Euler characteristics, functional central limit theorem, Normal approximation, Poisson process, Random geometric complexes, smooth bootstrap, Stochastic geometry, topological data analysis, weak convergence, 60F05, 62F40, 60B10, 60D05
Nimrod Segol, Boaz Nadler
Electron. J. Statist. 15 (2), 4510-4544, (2021) DOI: 10.1214/21-EJS1905
KEYWORDS: EM algorithm, Gaussian mixture models, 62F10, 62F99
Wenli Shi, Subhashis Ghosal, Ryan Martin
Electron. J. Statist. 15 (2), 4545-4579, (2021) DOI: 10.1214/21-EJS1904
KEYWORDS: high-dimensional inference, Gaussian graphical model, measurement error, Posterior contraction rate, Sparsity
Mohamed El Machkouri, Lucas Reding
Electron. J. Statist. 15 (2), 4580-4624, (2021) DOI: 10.1214/21-EJS1878
KEYWORDS: Recursive estimator, asymptotic normality, quadratic mean error, Random fields, Strong mixing, Weak dependence, Density estimation, Regression estimation, Lindeberg’s method, m-dependence, physical dependence measure, 60G60, 62G20, 62G07, 62G08, 62G05
Dhruv Medarametla, Emmanuel Candès
Electron. J. Statist. 15 (2), 4625-4658, (2021) DOI: 10.1214/21-EJS1910
KEYWORDS: distribution-free, nonparametric inference, median regression, Quantile regression, conformal inference, 62G08, 62G15
Stephan Clémençon, Myrto Limnios, Nicolas Vayatis
Electron. J. Statist. 15 (2), 4659-4717, (2021) DOI: 10.1214/21-EJS1907
KEYWORDS: Bipartite ranking, Concentration inequalities, empirical risk minimization, generalization bounds, rank process, statistical learning theory, two-sample linear rank statistics, 62G99, 68Q32, 60E15, 62C12
Manon Costa, Sébastien Gadat
Electron. J. Statist. 15 (2), 4718-4769, (2021) DOI: 10.1214/21-EJS1908
KEYWORDS: stochastic approximation, quantile and superquantile, non-asymptotic controls, diffusion approximation, 62L20, 60F05, 62P05
Johannes Buck, Claudia Klüppelberg
Electron. J. Statist. 15 (2), 4770-4822, (2021) DOI: 10.1214/21-EJS1903
KEYWORDS: Graphical model, Bayesian network, Directed acyclic graph, Extreme value analysis, max-linear model, noisy model, regular variation, 60G70, 62F12, 62G32, 62H22
Emmanuel Caron, Jérôme Dedecker, Bertrand Michel
Electron. J. Statist. 15 (2), 4823-4867, (2021) DOI: 10.1214/21-EJS1885
KEYWORDS: Nonparametric regression, Model selection, adaptive estimation, short memory, long memory, 62G05, 62M10, 60G22
Seongoh Park, Xinlei Wang, Johan Lim
Electron. J. Statist. 15 (2), 4868-4915, (2021) DOI: 10.1214/21-EJS1892
KEYWORDS: convergence rate, Covariance matrix, dependent missing structure, element-wise maximum norm, inverse probability weighting, 62H12, 60E15
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