Front Matter
No abstract available
Articles
Mark F. Schilling
Mark F. Schilling
Y.-S. Chow, S. Geman, L.-D. Wu
Kent R. Bailey
Richard Gill
Peter McCullagh
Patricia Grambsch
Adriaan P. Van Der Plas
Bruce G. Lindsay
C. F. Jeff Wu
G. A. Barnard, D. A. Sprott
David A. Lane, William D. Sudderth
Alexander Felzenbaum, Sergiu Hart, Yosef Hochberg
Gary Lorden
John Rice, Murray Rosenblatt
Masanobu Taniguchi
Wilbert C. M. Kallenberg
Kerry G. Bemis, Vasant P. Bhapkar
Justus F. Seely, Yahia El-Bassiouni
Andrew L. Rukhin
Jeffrey S. Simonoff
Ronald W. Butler
Ker-Chau Li
Ching-Shui Cheng
Optimal Design and Refinement of the Linera Model with Applications to Repeated Measurements Designs
Joachim Kunert
Dibyen Majumdar, William I. Notz
Yuan Yan Chen, Myles Hollander, Naftali A. Langberg
T. P. Liu, M. E. Thompson
Kumar Joag-Dev, Frank Proschan
Glen Meeden, Malay Ghosh
Michael D. Huffman
David M. Mason
Short Communications
Brian D. Macpherson, Wayne A. Fuller
W. Eberl Jr
Hideaki Sakai
James D. Malley
Articles
Joseph B. Kadane, Herbert A. Simon
No abstract available
I. V. Basawa
No abstract available
D. Lambert, W. J. Hall
No abstract available
Ching-Shui Cheng, Chien-Fu Wu
No abstract available
Back Matter
No abstract available