Abstract
We continue our study of the inventory accumulation introduced by Sheffield (2011), which encodes a random planar map decorated by a collection of loops sampled from the critical Fortuin-Kasteleyn (FK) model. We prove various local estimates for the inventory accumulation model, i.e., estimates for the precise number of symbols of a given type in a reduced word sampled from the model. Using our estimates, we obtain the scaling limit of the associated two-dimensional random walk conditioned on the event that it stays in the first quadrant for one unit of time and ends up at a particular position in the interior of the first quadrant. We also obtain the exponent for the probability that a word of length
Citation
Ewain Gwynne. Xin Sun. "Scaling limits for the critical Fortuin-Kasteleyn model on a random planar map II: local estimates and empty reduced word exponent." Electron. J. Probab. 22 1 - 56, 2017. https://doi.org/10.1214/17-EJP64
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