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2013 Internal Due Date Assignment in a Wafer Fabrication Factory by an Effective Fuzzy-Neural Approach
Toly Chen
J. Appl. Math. 2013(SI24): 1-13 (2013). DOI: 10.1155/2013/979862

Abstract

Owing to the complexity of the wafer fabrication, the due date assignment of each job presents a challenging problem to the production planning and scheduling people. To tackle this problem, an effective fuzzy-neural approach is proposed in this study to improve the performance of internal due date assignment in a wafer fabrication factory. Some innovative treatments are taken in the proposed methodology. First, principal component analysis (PCA) is applied to construct a series of linear combinations of the original variables to form a new variable, so that these new variables are unrelated to each other as much as possible, and the relationship among them can be reflected in a better way. In addition, the simultaneous application of PCA, fuzzy c-means (FCM), and back propagation network (BPN) further improved the estimation accuracy. Subsequently, the iterative upper bound reduction (IUBR) approach is proposed to determine the allowance that will be added to the estimated job cycle time. An applied case that uses data collected from a wafer fabrication factory illustrates this effective fuzzy-neural approach.

Citation

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Toly Chen. "Internal Due Date Assignment in a Wafer Fabrication Factory by an Effective Fuzzy-Neural Approach." J. Appl. Math. 2013 (SI24) 1 - 13, 2013. https://doi.org/10.1155/2013/979862

Information

Published: 2013
First available in Project Euclid: 14 March 2014

Digital Object Identifier: 10.1155/2013/979862

Rights: Copyright © 2013 Hindawi

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Vol.2013 • No. SI24 • 2013
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