Claire Lacour
Electron. J. Statist. 2, 1-39, (2008) DOI: 10.1214/07-EJS111
KEYWORDS: Hidden Markov chain, Transition density, nonparametric estimation, Model selection, rate of convergence, 62G05, 62M05, 62H12
Joseph Ngatchou-Wandji
Electron. J. Statist. 2, 40-62, (2008) DOI: 10.1214/07-EJS157
KEYWORDS: Conditional least-squares estimation, Conditional likelihood estimation, Heteroscedastic models, kernel density estimation, LaTeX2e, 62M10, 62F12
Subhashis Ghosal, Jüri Lember, Aad van der Vaart
Electron. J. Statist. 2, 63-89, (2008) DOI: 10.1214/07-EJS090
KEYWORDS: Adaptation, rate of convergence, Bayes factor, rate of contraction, 62G07, 62G20, 62C10, 65U05, 68T05
Karim Lounici
Electron. J. Statist. 2, 90-102, (2008) DOI: 10.1214/08-EJS177
KEYWORDS: linear model, Lasso, Dantzig, Sparsity, Model selection, sign consistency, 62J05, 62F12
Seongho Wu, Hui Zou, Ming Yuan
Electron. J. Statist. 2, 103-117, (2008) DOI: 10.1214/07-EJS125
KEYWORDS: ‎classification‎, Heredity, nonparametric estimation, Support Vector Machine, Variable selection, 68T10, 62G05
Jean-François Marckert
Electron. J. Statist. 2, 118-126, (2008) DOI: 10.1214/07-EJS131
KEYWORDS: empirical process, Donsker Theorem, Brownian bridge, 62G30, 60F17
Xiaohui Wang, J. S. Marron
Electron. J. Statist. 2, 127-148, (2008) DOI: 10.1214/07-EJS137
KEYWORDS: manifold learning, intrinsic dimension, scale space, hypothesis test, Multivariate analysis
Hao Helen Zhang, Yufeng Liu, Yichao Wu, Ji Zhu
Electron. J. Statist. 2, 149-167, (2008) DOI: 10.1214/08-EJS122
KEYWORDS: ‎classification‎, L_1-norm penalty, multicategory, sup-norm, SVM, 62H30
Benhuai Xie, Wei Pan, Xiaotong Shen
Electron. J. Statist. 2, 168-212, (2008) DOI: 10.1214/08-EJS194
KEYWORDS: BIC, EM algorithm, High-dimension but low-sample size, L_1 penalization, microarray gene expression, mixture model, penalized likelihood, 62H30
Cécile Hardouin, Jian-Feng Yao
Electron. J. Statist. 2, 213-233, (2008) DOI: 10.1214/08-EJS173
KEYWORDS: Multivariate analysis, distribution theory, Mixed-state variables, Auto-models, Spatial cooperation, Markov random fields, 62H05, 62E10, 62M40
Jean-Michel Billiot, Jean-François Coeurjolly, Rémy Drouilhet
Electron. J. Statist. 2, 234-264, (2008) DOI: 10.1214/07-EJS160
KEYWORDS: stationary marked Gibbs point processes, pseudolikelihood method, minimum contrast estimators, 60G55, 60J25
Bert van Es, Shota Gugushvili, Peter Spreij
Electron. J. Statist. 2, 265-297, (2008) DOI: 10.1214/07-EJS121
KEYWORDS: asymptotic normality, atomic distribution, Deconvolution, kernel density estimator, 62G07, 62G20
Yuefeng Wu, Subhashis Ghosal
Electron. J. Statist. 2, 298-331, (2008) DOI: 10.1214/07-EJS130
KEYWORDS: Bayesian density estimation, Dirichlet process, kernel mixture, Kullback-Leibler property, posterior consistency, 62G07, 62G20
Xiaohong Lan, Domenico Marinucci
Electron. J. Statist. 2, 332-367, (2008) DOI: 10.1214/08-EJS197
KEYWORDS: bispectrum, Needlets, Spherical random fields, Cosmic Microwave Background radiation, High Resolution Asymptotics, 62G20, 62M15, 60B15, 60G60
Zhiyi Chi
Electron. J. Statist. 2, 368-411, (2008) DOI: 10.1214/07-EJS147
KEYWORDS: multiple hypothesis testing, pFDR, 62G10, 62H15, 62G20
Florent Autin
Electron. J. Statist. 2, 412-431, (2008) DOI: 10.1214/08-EJS205
KEYWORDS: Besov spaces, estimation, maxiset, minimax risk, rate of convergence, Thresholding methods, tree structure, 62G05, 62G07
Massimo Bilancia, Girolamo Stea
Electron. J. Statist. 2, 432-453, (2008) DOI: 10.1214/07-EJS123
KEYWORDS: Airborne particulate matter, PM_{10}, Singular Spectrum Analysis - SSA, Generalized additive models - GAM, 62P12, 62J99
Luke A. Prendergast
Electron. J. Statist. 2, 454-467, (2008) DOI: 10.1214/08-EJS201
KEYWORDS: distance between subspaces, influential observations, perturbation, Principal Component Analysis, 62F35, 62H12
Lutz Dümbgen, Bernd-Wolfgang Igl, Axel Munk
Electron. J. Statist. 2, 468-493, (2008) DOI: 10.1214/08-EJS245
KEYWORDS: nearest neighbors, nonparametric, optimality, Permutation test, prediction region, ROC curve, typicality index, validity, 62C05, 62F25, 62G09, 62G15, 62H30
Adam J. Rothman, Peter J. Bickel, Elizaveta Levina, Ji Zhu
Electron. J. Statist. 2, 494-515, (2008) DOI: 10.1214/08-EJS176
KEYWORDS: Covariance matrix, high dimension low sample size, large p small n, Lasso, Sparsity, Cholesky decomposition, 62H20, 62H12
Mohammed Debbarh, Vivian Viallon
Electron. J. Statist. 2, 516-541, (2008) DOI: 10.1214/07-EJS117
KEYWORDS: nonparametric estimation, additive regression function, Right censored data, uniform laws of the logarithm, 62G08, 62N01
Christophe Giraud
Electron. J. Statist. 2, 542-563, (2008) DOI: 10.1214/08-EJS228
KEYWORDS: Gaussian graphical model, random matrices, Model selection, Penalized empirical risk, 62G08, 15A52, 62J05
Konstantinos Fokianos
Electron. J. Statist. 2, 564-580, (2008) DOI: 10.1214/07-EJS078
KEYWORDS: empirical likelihood, Biased sampling, Penalty, semiparametric, shrinkage, Mean square error, power, 62G05, 62G20
Ingrid Van Keilegom, César Sánchez Sellero, Wenceslao González Manteiga
Electron. J. Statist. 2, 581-604, (2008) DOI: 10.1214/07-EJS152
KEYWORDS: Marked empirical process, model check for regression, Nonlinear regression, Partial linear model, residuals, 62E20, 62F03, 62F05, 62F40, 62G08, 62G10
Yuval Nardi, Alessandro Rinaldo
Electron. J. Statist. 2, 605-633, (2008) DOI: 10.1214/08-EJS200
KEYWORDS: least squares, Sparsity, group-Lasso, Model selection, Oracle inequalities, Persistence, 62J05, 62F12
Seth D. Tribble, Art B. Owen
Electron. J. Statist. 2, 634-660, (2008) DOI: 10.1214/07-EJS162
KEYWORDS: Completely uniformly distributed, Gibbs sampler, equidistribution, probit, quasi-Monte Carlo, 62F15, 11K45, 11K41
Jean-Michel Loubes, Carenne Ludeña
Electron. J. Statist. 2, 661-677, (2008) DOI: 10.1214/07-EJS115
KEYWORDS: Inverse problems, adaptive estimation, regularization, 62G05, 34K29
Jianhua Z. Huang, Haipeng Shen, Andreas Buja
Electron. J. Statist. 2, 678-695, (2008) DOI: 10.1214/08-EJS218
KEYWORDS: Functional data analysis, Penalization, regularization, Singular value decomposition, 62G08, 62H25, 65F30
Hilmar Böhm, Rainer von Sachs
Electron. J. Statist. 2, 696-721, (2008) DOI: 10.1214/08-EJS236
Rafał Kulik
Electron. J. Statist. 2, 722-740, (2008) DOI: 10.1214/07-EJS154
KEYWORDS: Long range dependence, linear processes, error-in-variables models, Deconvolution, 62G05, 62G07, 60F05
Guillaume Lecué
Electron. J. Statist. 2, 741-773, (2008) DOI: 10.1214/07-EJS015
KEYWORDS: ‎classification‎, Sparsity, Decision dyadic trees, Minimax rates, Aggregation, 62G05, 62C20
Ilenia Epifani, Steven N. MacEachern, Mario Peruggia
Electron. J. Statist. 2, 774-806, (2008) DOI: 10.1214/08-EJS259
KEYWORDS: infinite variance, influence, leverage, Marginal Residual Sum of Squares, Markov chain Monte Carlo, model averaging, moment index, tail behavior, 62F15, 62J20
Oliver Johnson
Electron. J. Statist. 2, 807-828, (2008) DOI: 10.1214/08-EJS255
KEYWORDS: principal components, principal fitted components, Random matrix theory, regression, 62H10, 62E20
Jiaona Li, Zuoxiang Peng, Saralees Nadarajah
Electron. J. Statist. 2, 829-847, (2008) DOI: 10.1214/08-EJS276
KEYWORDS: asymptotic normality, Location invariant Hill-type heavy tailed index estimator, second order regular variation, 62G32, 65C05
Yang Xing
Electron. J. Statist. 2, 848-862, (2008) DOI: 10.1214/08-EJS244
KEYWORDS: Adaptation, rate of convergence, posterior distribution, density function, log spline density, 62G07, 62G20, 62C10
Piotr Fryzlewicz
Electron. J. Statist. 2, 863-896, (2008) DOI: 10.1214/07-EJS139
KEYWORDS: Besov spaces, Exponential inequality, Heteroscedasticity, Nadaraya-Watson estimator, Nonparametric regression, variance function, variance-stabilising transform, Wavelets, 62G08, 62G05, 62G20
Cristina Butucea, Catherine Matias, Christophe Pouet
Electron. J. Statist. 2, 897-915, (2008) DOI: 10.1214/08-EJS225
KEYWORDS: Adaptive nonparametric tests, Convolution model, Goodness-of-fit tests, Infinitely differentiable functions, Partially known noise, Quadratic functional estimation, Sobolev classes, Stable laws, 62F12, 62G05, 62G10, 62G20
Y. Fan, D.S. Leslie, M.P. Wand
Electron. J. Statist. 2, 916-938, (2008) DOI: 10.1214/07-EJS158
KEYWORDS: generalised additive models, longitudinal data analysis, Nonparametric regression, sequential Monte Carlo sampler
Dan J. Spitzner
Electron. J. Statist. 2, 939-962, (2008) DOI: 10.1214/08-EJS172
KEYWORDS: Functional data analysis, Quadratic forms, high-dimensional testing, rates of testing, Fourier decomposition, 62G10, 62J05, 46N30
Gilles Blanchard, Etienne Roquain
Electron. J. Statist. 2, 963-992, (2008) DOI: 10.1214/08-EJS180
KEYWORDS: False discovery rate, multiple testing, step-up, step-down, step-up-down, weighted p-values, PRDS condition, 62J15, 62G10
Béatrice Laurent, Carenne Ludeña, Clémentine Prieur
Electron. J. Statist. 2, 993-1020, (2008) DOI: 10.1214/07-EJS127
KEYWORDS: Nonparametric regression, White noise model, adaptive estimation, linear functionals, Model selection, pointwise adaptive estimation, Oracle inequalities, 62G05, 62G08
Yoram Gat
Electron. J. Statist. 2, 1021-1027, (2008) DOI: 10.1214/08-EJS308
KEYWORDS: 62G15, 62G30
Éric Marchand, William E. Strawderman, Keven Bosa, Aziz Lmoudden
Electron. J. Statist. 2, 1028-1042, (2008) DOI: 10.1214/08-EJS292
KEYWORDS: Bayesian credible sets, restricted parameter space, confidence intervals, frequentist coverage probability, logconcavity, 62F10, 62F30, 62C10, 62C15, 35Q15, 45B05, 42A99
Davit Varron
Electron. J. Statist. 2, 1043-1064, (2008) DOI: 10.1214/08-EJS193
KEYWORDS: Empricial processes, Functional limit theorems, strong theorems, Density estimation, LaTeXe, 60F15, 60F17, 62G07
Pierre Neuvial
Electron. J. Statist. 2, 1065-1110, (2008) DOI: 10.1214/08-EJS207
KEYWORDS: multiple hypothesis testing, Benjamini-Hochberg procedure, FDP, FDR, 62G10, 62H15, 60F05
Ricardo Ríos, Luis-Angel Rodríguez
Electron. J. Statist. 2, 1111-1128, (2008) DOI: 10.1214/08-EJS272
KEYWORDS: autoregressive processes, hidden Markov chains, penalized maximum likelihood, 62F05, 62M05
Pierre Alquier
Electron. J. Statist. 2, 1129-1152, (2008) DOI: 10.1214/08-EJS288
KEYWORDS: Regression estimation, Statistical learning, Confidence regions, shrinkage and thresholding methods, Lasso, 62G08, 62J07, 62G15, 68T05
Florentina Bunea
Electron. J. Statist. 2, 1153-1194, (2008) DOI: 10.1214/08-EJS287
KEYWORDS: Lasso, Elastic net, ℓ_1 and ℓ_1+ℓ_2 regularization, Penalty, sparse, consistent, Variable selection, regression, generalized linear models, logistic regression, high dimensions, 62J07, 62J02, 62G08
Katia Meziani
Electron. J. Statist. 2, 1195-1223, (2008) DOI: 10.1214/08-EJS286
KEYWORDS: density matrix, Goodness-of fit test, Minimax rates, Nonparametric test, Pattern Functions estimation, quantum homodyne tomography, Wigner function, 62G05, 62G10, 62G20, 81V80
Karine Bertin, Guillaume Lecué
Electron. J. Statist. 2, 1224-1241, (2008) DOI: 10.1214/08-EJS327
KEYWORDS: Dimension reduction, high dimension, Lasso, 62G08
Nicolas J-B. Brunel
Electron. J. Statist. 2, 1242-1267, (2008) DOI: 10.1214/07-EJS132
KEYWORDS: asymptotics, M-estimator, Nonparametric regression, ordinary differential equation, Parametric estimation, splines, 62F99
M. Evans, M. Shakhatreh
Electron. J. Statist. 2, 1268-1280, (2008) DOI: 10.1214/07-EJS126
KEYWORDS: relative surprise inferences, probability of covering a false value, unbiasedness, Bayes factors, relative belief ratios, Invariance, reparameterizations
Ismaël Castillo
Electron. J. Statist. 2, 1281-1299, (2008) DOI: 10.1214/08-EJS273
KEYWORDS: Bayesian nonparametrics, Gaussian process priors, lower bounds, 62G05, 62G20
M.C. Jones, Barry C. Arnold
Electron. J. Statist. 2, 1300-1308, (2008) DOI: 10.1214/08-EJS301
KEYWORDS: double symmetry, Lognormal distribution, moment equivalence, weighted distribution, 62E10, 60E05
Gopal K. Basak, Philip Lee
Electron. J. Statist. 2, 1309-1344, (2008) DOI: 10.1214/08-EJS290
KEYWORDS: Ornstein-Uhlenbeck processes, Stable process, drift coefficient matrix, estimation, consistency, Asymptotic efficiency, 62M05, 60F15
Xavier Gendre
Electron. J. Statist. 2, 1345-1372, (2008) DOI: 10.1214/08-EJS267
KEYWORDS: Gaussian regression, Heteroscedasticity, Model selection, Kullback risk, convergence rate, 62G08
Frédéric Lavancier
Electron. J. Statist. 2, 1373-1390, (2008) DOI: 10.1214/08-EJS280
KEYWORDS: long memory, V/S statistic, Random fields
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