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2017 Scaling limits for the critical Fortuin-Kasteleyn model on a random planar map II: local estimates and empty reduced word exponent
Ewain Gwynne, Xin Sun
Electron. J. Probab. 22: 1-56 (2017). DOI: 10.1214/17-EJP64

Abstract

We continue our study of the inventory accumulation introduced by Sheffield (2011), which encodes a random planar map decorated by a collection of loops sampled from the critical Fortuin-Kasteleyn (FK) model. We prove various local estimates for the inventory accumulation model, i.e., estimates for the precise number of symbols of a given type in a reduced word sampled from the model. Using our estimates, we obtain the scaling limit of the associated two-dimensional random walk conditioned on the event that it stays in the first quadrant for one unit of time and ends up at a particular position in the interior of the first quadrant. We also obtain the exponent for the probability that a word of length $2n$ sampled from the inventory accumulation model corresponds to an empty reduced word, which is equivalent to an asymptotic formula for the partition function of the critical FK planar map model. The estimates of this paper will be used in a subsequent paper to obtain the scaling limit of the lattice walk associated with a finite-volume FK planar map.

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Ewain Gwynne. Xin Sun. "Scaling limits for the critical Fortuin-Kasteleyn model on a random planar map II: local estimates and empty reduced word exponent." Electron. J. Probab. 22 1 - 56, 2017. https://doi.org/10.1214/17-EJP64

Information

Received: 21 October 2015; Accepted: 28 April 2017; Published: 2017
First available in Project Euclid: 6 May 2017

zbMATH: 1365.60028
MathSciNet: MR3661659
Digital Object Identifier: 10.1214/17-EJP64

Subjects:
Primary: 60F17, 60G50
Secondary: 82B27

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