Open Access
2002 GROUP TESTING IN BIPARTITE GRAPHS
Su-Tzu Juan, Gerard J. Chang
Taiwanese J. Math. 6(1): 67-73 (2002). DOI: 10.11650/twjm/1500407400

Abstract

This paper investigates the group testing problem in graphs as follows. Given a graph $G=(V,E)$, determine the minimum number $t(G)$ such that $t(G)$ tests are sufficient to identify an unknown edge $e$ with each test specifies a subset $X\subseteq V$ and answers whether the unknown edge $e$ is in $G[X]$ or not. Damaschke proved that $\lceil\log_2 e(G)\rceil \le t(G) \le \lceil\log_2 e(G)\rceil +1$ for any graph $G,$ where $e(G)$ is the number of edges of $G$. While there are infinitely many complete graphs that attain the upper bound, it was conjectured by Chang and Hwang that the lower bound is attained by all bipartite graphs. This paper verifies the conjecture for bipartite graphs $G$ with $e(G)\le 2^4$ or $2^{k-1} \lt e(G) \le 2^{k-1} + 2^{k-3}+2^{k-6}+19 \cdot 2^{\frac{k-7}{2}}-1$ for $k \ge 5$.

Citation

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Su-Tzu Juan. Gerard J. Chang. "GROUP TESTING IN BIPARTITE GRAPHS." Taiwanese J. Math. 6 (1) 67 - 73, 2002. https://doi.org/10.11650/twjm/1500407400

Information

Published: 2002
First available in Project Euclid: 18 July 2017

zbMATH: 0999.05097
MathSciNet: MR1884455
Digital Object Identifier: 10.11650/twjm/1500407400

Subjects:
Primary: 05C99

Keywords: algorithm , Bipartite graph , complete graph , group testing , induced subgraph

Rights: Copyright © 2002 The Mathematical Society of the Republic of China

Vol.6 • No. 1 • 2002
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