December 2015 Phylogenetic confidence intervals for the optimal trait value
Krzysztof Bartoszek, Serik Sagitov
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J. Appl. Probab. 52(4): 1115-1132 (December 2015). DOI: 10.1239/jap/1450802756

Abstract

We consider a stochastic evolutionary model for a phenotype developing amongst n related species with unknown phylogeny. The unknown tree is modelled by a Yule process conditioned on n contemporary nodes. The trait value is assumed to evolve along lineages as an Ornstein-Uhlenbeck process. As a result, the trait values of the n species form a sample with dependent observations. We establish three limit theorems for the sample mean corresponding to three domains for the adaptation rate. In the case of fast adaptation, we show that for large n the normalized sample mean is approximately normally distributed. Using these limit theorems, we develop novel confidence interval formulae for the optimal trait value.

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Krzysztof Bartoszek. Serik Sagitov. "Phylogenetic confidence intervals for the optimal trait value." J. Appl. Probab. 52 (4) 1115 - 1132, December 2015. https://doi.org/10.1239/jap/1450802756

Information

Published: December 2015
First available in Project Euclid: 22 December 2015

zbMATH: 1332.62278
MathSciNet: MR3439175
Digital Object Identifier: 10.1239/jap/1450802756

Subjects:
Primary: 62M05 , 62P10
Secondary: 60H30 , 92B99

Keywords: central limit theorem , conditioned Yule process , macroevolution , Martingales , Ornstein-Uhlenbeck process , Phylogenetics

Rights: Copyright © 2015 Applied Probability Trust

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Vol.52 • No. 4 • December 2015
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