Journal of Applied Probability

Stochastic modeling for environmental stress screening

Ji Hwan Cha and Maxim Finkelstein

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Abstract

Environmental stress screening (ESS) of manufactured items is used to reduce the occurrence of future failures that are caused by latent defects by eliminating the items with these defects. Some practical descriptions of the relevant ESS procedures can be found in the literature; however, the appropriate stochastic modeling and the corresponding thorough analysis have not been reported. In this paper we develop a stochastic model for the ESS, analyze the effect of this operation on the population characteristics of the screened items, and also consider the relevant optimization issues.

Article information

Source
J. Appl. Probab. Volume 51, Number 2 (2014), 387-399.

Dates
First available in Project Euclid: 12 June 2014

Permanent link to this document
https://projecteuclid.org/euclid.jap/1402578632

Digital Object Identifier
doi:10.1239/jap/1402578632

Mathematical Reviews number (MathSciNet)
MR3217774

Zentralblatt MATH identifier
1297.90022

Subjects
Primary: 60K10: Applications (reliability, demand theory, etc.)
Secondary: 62P30: Applications in engineering and industry

Keywords
Environmental stress screening burn-in stress-strength model shock model nonhomogeneous Poisson process

Citation

Cha, Ji Hwan; Finkelstein, Maxim. Stochastic modeling for environmental stress screening. J. Appl. Probab. 51 (2014), no. 2, 387--399. doi:10.1239/jap/1402578632. https://projecteuclid.org/euclid.jap/1402578632.


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