Journal of Applied Probability

An integrated probabilistic model for assessing a nanocomponent's reliability

Nader Ebrahimi and Yarong Yang

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Abstract

We construct an integrated probabilistic model to capture interactions between atoms of a nanocomponent. We then use this model to assess reliabilities of nanocomponents with different structures. Several properties of our proposed model are also described under a sparseness condition. The model is an extension of our previous model based on Markovian random field theory. The proposed integrated model is flexible in that pairwise relationship information among atoms as well as features of individual atoms can be easily incorporated. An important feature that distinguishes the integrated probabilistic model from our previous model is that the integrated approach uses all available sources of information with different weights for different types of interaction. In this paper we consider the nanocomponent at a fixed moment of time, say the present moment, and we assume that the present state of the nanocomponent depends only on the present states of its atoms.

Article information

Source
J. Appl. Probab., Volume 48, Number 3 (2011), 832-842.

Dates
First available in Project Euclid: 23 September 2011

Permanent link to this document
https://projecteuclid.org/euclid.jap/1316796918

Digital Object Identifier
doi:10.1239/jap/1316796918

Mathematical Reviews number (MathSciNet)
MR2884819

Zentralblatt MATH identifier
1241.62142

Subjects
Primary: 60N05
Secondary: 60G55: Point processes 90B25: Reliability, availability, maintenance, inspection [See also 60K10, 62N05]

Keywords
Associated random variable conditionally increasing in sequence Gibbs distribution Gibbs sampling Markov random field reliability

Citation

Ebrahimi, Nader; Yang, Yarong. An integrated probabilistic model for assessing a nanocomponent's reliability. J. Appl. Probab. 48 (2011), no. 3, 832--842. doi:10.1239/jap/1316796918. https://projecteuclid.org/euclid.jap/1316796918


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