Electronic Journal of Statistics
- Electron. J. Statist.
- Volume 9, Number 1 (2015), 1583-1607.
Computationally efficient confidence intervals for cross-validated area under the ROC curve estimates
Erin LeDell, Maya Petersen, and Mark van der Laan
Abstract
In binary classification problems, the area under the ROC curve (AUC) is commonly used to evaluate the performance of a prediction model. Often, it is combined with cross-validation in order to assess how the results will generalize to an independent data set. In order to evaluate the quality of an estimate for cross-validated AUC, we obtain an estimate of its variance. For massive data sets, the process of generating a single performance estimate can be computationally expensive. Additionally, when using a complex prediction method, the process of cross-validating a predictive model on even a relatively small data set can still require a large amount of computation time. Thus, in many practical settings, the bootstrap is a computationally intractable approach to variance estimation. As an alternative to the bootstrap, we demonstrate a computationally efficient influence curve based approach to obtaining a variance estimate for cross-validated AUC.
Article information
Source
Electron. J. Statist., Volume 9, Number 1 (2015), 1583-1607.
Dates
Received: December 2014
First available in Project Euclid: 24 July 2015
Permanent link to this document
https://projecteuclid.org/euclid.ejs/1437742107
Digital Object Identifier
doi:10.1214/15-EJS1035
Mathematical Reviews number (MathSciNet)
MR3376118
Zentralblatt MATH identifier
1327.62298
Subjects
Primary: 62G15: Tolerance and confidence regions 62G05: Estimation
Secondary: 62G20: Asymptotic properties
Keywords
AUC binary classification confidence intervals cross-validation influence curve influence function machine learning model selection ROC variance estimation
Citation
LeDell, Erin; Petersen, Maya; van der Laan, Mark. Computationally efficient confidence intervals for cross-validated area under the ROC curve estimates. Electron. J. Statist. 9 (2015), no. 1, 1583--1607. doi:10.1214/15-EJS1035. https://projecteuclid.org/euclid.ejs/1437742107

