Abstract
The dead leaves model (DLM) provides a random tessellation of $d$-space, representing the visible portions of fallen leaves on the ground when $d=2$. For $d=1$, we establish formulae for the intensity, two-point correlations, and asymptotic covariances for the point process of cell boundaries, along with a functional CLT. For $d=2$ we establish analogous results for the random surface measure of cell boundaries, and also determine the intensity of cells in a more general setting than in earlier work of Cowan and Tsang. We introduce a general notion of dead leaves random measures and give formulae for means, asymptotic variances and functional CLTs for these measures; this has applications to various other quantities associated with the DLM.
Citation
Mathew D. Penrose. "Leaves on the line and in the plane." Electron. J. Probab. 25 1 - 40, 2020. https://doi.org/10.1214/20-EJP447
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