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VOL. 6.6 | 1972 X-ray fluorescence—an improved analytical tool for trace element studies
Frederick S. Goulding

Editor(s) Lucien M. Le Cam, Jerzy Neyman, Elizabeth L. Scott

Berkeley Symp. on Math. Statist. and Prob., 1972: 401-431 (1972)
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PROCEEDINGS ARTICLE
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