Open Access
December 2003 Parameter estimation for the supercritical contact process
Marta Fiocco, Willem R. Van Zwet
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Bernoulli 9(6): 1071-1092 (December 2003). DOI: 10.3150/bj/1072215201

Abstract

Contact processes -- and, more generally, interacting particle processes -- can serve as models for a large variety of statistical problems, especially if we allow some simple modifications that do not essentially complicate the mathematical treatment of these processes. We begin a statistical study of the supercritical contact process that starts with a single infected site at the origin and is conditioned on survival of the infection. We consider the statistical problem of estimating the parameter $\lambda$ of the process on the basis of an observation of the process at a single time $t$. We propose an estimator of $\lambda$ and show that it is consistent and asymptotically normal as $t \rightarrow \infty$.

Citation

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Marta Fiocco. Willem R. Van Zwet. "Parameter estimation for the supercritical contact process." Bernoulli 9 (6) 1071 - 1092, December 2003. https://doi.org/10.3150/bj/1072215201

Information

Published: December 2003
First available in Project Euclid: 23 December 2003

zbMATH: 1052.62087
MathSciNet: MR2046818
Digital Object Identifier: 10.3150/bj/1072215201

Keywords: contact process , Parameter estimation , random mask , shrinking , supercritical

Rights: Copyright © 2003 Bernoulli Society for Mathematical Statistics and Probability

Vol.9 • No. 6 • December 2003
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