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January 1996 The cut-off phenomenon for random reflections
Ursula Porod
Ann. Probab. 24(1): 74-96 (January 1996). DOI: 10.1214/aop/1042644708

Abstract

For many random walks on "sufficiently large" finite groups the so-called cut-off phenomenon occurs: roughly stated, there exists a number $k_0$ , depending on the size of the group, such that $k_0$ steps are necessary and sufficient for the random walk to closely approximate uniformity. As a first example on a continuous group, Rosenthal recently proved the occurrence of this cut-off phenomenon for a specific random walk on $SO(N)$. Here we present and [for the case of $O(N)$] prove results for random walks on $O(N), U(N)$ and $Sp(N)$, where the one-step distribution is a suitable probability measure concentrated on reflections. In all three cases the cut-off phenomenon occurs at $k_0 = 1/2 N\log N$.

Citation

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Ursula Porod. "The cut-off phenomenon for random reflections." Ann. Probab. 24 (1) 74 - 96, January 1996. https://doi.org/10.1214/aop/1042644708

Information

Published: January 1996
First available in Project Euclid: 15 January 2003

zbMATH: 0854.60068
MathSciNet: MR1387627
Digital Object Identifier: 10.1214/aop/1042644708

Subjects:
Primary: 60B15 , 60J15

Keywords: cut-off phenomenon , Fourier analysis , Random walk , reflection

Rights: Copyright © 1996 Institute of Mathematical Statistics

Vol.24 • No. 1 • January 1996
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