Open Access
May 2005 Cramér’s estimate for a reflected Lévy process
R. A. Doney, R. A. Maller
Ann. Appl. Probab. 15(2): 1445-1450 (May 2005). DOI: 10.1214/105051605000000016

Abstract

The natural analogue for a Lévy process of Cramér’s estimate for a reflected random walk is a statement about the exponential rate of decay of the tail of the characteristic measure of the height of an excursion above the minimum. We establish this estimate for any Lévy process with finite negative mean which satisfies Cramér’s condition, and give an explicit formula for the limiting constant. Just as in the random walk case, this leads to a Poisson limit theorem for the number of “high excursions.”

Citation

Download Citation

R. A. Doney. R. A. Maller. "Cramér’s estimate for a reflected Lévy process." Ann. Appl. Probab. 15 (2) 1445 - 1450, May 2005. https://doi.org/10.1214/105051605000000016

Information

Published: May 2005
First available in Project Euclid: 3 May 2005

zbMATH: 1272.68116
MathSciNet: MR2134110
Digital Object Identifier: 10.1214/105051605000000016

Subjects:
Primary: 60G17 , 60G51

Keywords: high excursions , maximal segmental score , Maximum of reflected process , Poisson limit theorem

Rights: Copyright © 2005 Institute of Mathematical Statistics

Vol.15 • No. 2 • May 2005
Back to Top