Journal of Applied Probability
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A general shock mode for a reliability system

Georgios Skoulakis

Source: J. Appl. Probab. Volume 37, Number 4 (2000), 925-935.

Abstract

We study a reliability system subject to shocks generated by a renewal point process. When a shock occurs, components fail independently of each other with equal probabilities that are random numbers drawn from a distribution that may differ from shock to shock. We first consider the case of a parallel system and derive closed expressions for the Laplace-Stieltjes transform and the expectation of the time to system failure and for its density in the case that the distribution function of the renewal process possesses a density. We then treat a more general system structure, which has some very important special cases, such as k-out-of-n:F systems, and derive analogous formulae.

Primary Subjects: 90B25
Secondary Subjects: 60K37
Keywords: System reliability; shock models; random environment; parallel system; general system

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Links and Identifiers

Permanent link to this document: http://projecteuclid.org/euclid.jap/1014843073
Digital Object Identifier: doi:10.1239/jap/1014843073
Mathematical Reviews number (MathSciNet): MR1808858

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