Journal of Applied Probability

Distribution of the scan statistic for a sequence of bistate trials

James C. Fu
Source: J. Appl. Probab. Volume 38, Number 4 (2001), 908-916.

Abstract

Let Sn(r) = maxrtntk=t-r+1 Xk be the scan statistic of window size r for a sequence of n bistate trials {Xi}i=1n. The scan statistic Sn(r) has been successfully used in various fields of applied probability and statistics, and its distribution has been studied extensively in the literature. Currently, all existing formulae for the distribution of Sn(r) are rather complex, and they can only be numerically implemented when {Xi}i=1n is a sequence of Bernoulli trials, the window size r is less than 20 and the length of the sequence n is not too large. Hence, these formulae have been limiting the practical applications of the scan statistic. In this article, we derive a simple and effective formula for the distribution of Sn(r) via the finite Markov chain embedding technique to overcome some of the limitations of the existing complex formulae. This new formula can be applied when {Xi}i=1n is either a sequence of Bernoulli trials or a sequence of Markov dependent bistate trials. Selected numerical examples are given to illustrate our results.

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Primary Subjects: 60E05
Secondary Subjects: 60J10
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Links and Identifiers

Permanent link to this document: http://projecteuclid.org/euclid.jap/1011994181
Digital Object Identifier: doi:10.1239/jap/1011994181
Mathematical Reviews number (MathSciNet): MR1876548
Zentralblatt MATH identifier: 0995.60016


2012 © Applied Probability Trust

Journal of Applied Probability

Journal of Applied Probability