On the Wiener process approximation to Bayesian sequential testing problems
P. J. Bickel, and J. A. Yahav
Source: Proc. Sixth Berkeley Symp. on Math. Statist. and Prob., Vol. 1 (Univ. of Calif. Press, 1972), 57-83.
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Primary Subjects: 62L10
Full-text: Open access
Links and Identifiers
Permanent link to this document: http://projecteuclid.org/euclid.bsmsp/1200514086
Zentralblatt MATH identifier:
0233.62027
Mathematical Reviews number (MathSciNet):
MR0400578
Berkeley Symposium on Mathematical Statistics and Probability
