The Annals of Statistics

Asymptotically uniformly most powerful tests in parametric and semiparametric models

Sungsub Choi, W. J. Hall, and Anton Schick
Source: Ann. Statist. Volume 24, Number 2 (1996), 841-861.

Abstract

Tests of hypotheses about finite-dimensional parameters in a semiparametric model are studied from Pitman's moving alternative (or local) approach using Le Cam's local asymptotic normality concept. For the case of a real parameter being tested, asymptotically uniformly most powerful (AUMP) tests are characterized for one-sided hypotheses, and AUMP unbiased tests for two-sided ones. An asymptotic invariance principle is introduced for multidimensional hypotheses, and AUMP invariant tests are characterized. These provide optimality for Wald, Rao (score), Neyman-Rao (effective score) and likelihood ratio tests in parametric models, and for Neyman-Rao tests in semiparametric models when constructions are feasible. Inversions lead to asymptotically uniformly most accurate confidence sets. Examples include one-, two- and k-sample problems, a linear regression model with unknown error distribution and a proportional hazards regression model with arbitrary baseline hazards. Results are presented in a format that facilitates application in strictly parametric models.

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Primary Subjects: 62F05
Secondary Subjects: 62G20
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Links and Identifiers

Permanent link to this document: http://projecteuclid.org/euclid.aos/1032894469
Mathematical Reviews number (MathSciNet): MR1394992
Digital Object Identifier: doi:10.1214/aos/1032894469
Zentralblatt MATH identifier: 0860.62020

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MCGILL UNIVERSITY ROCHESTER, NEW YORK 14627 1020 PINE AVENUE WEST
MONTREAL, QUEBEC ´ ´ CANADA H3A 1A2 A. SCHICK DEPARTMENT OF MATHEMATICAL SCIENCES BINGHAMTON UNIVERSITY
BINGHAMTON, NEW YORK 13902-6000

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