The Annals of Applied Probability

Effective resistance of random trees

Louigi Addario-Berry, Nicolas Broutin, and Gábor Lugosi

Source: Ann. Appl. Probab. Volume 19, Number 3 (2009), 1092-1107.

Abstract

We investigate the effective resistance Rn and conductance Cn between the root and leaves of a binary tree of height n. In this electrical network, the resistance of each edge e at distance d from the root is defined by re=2dXe where the Xe are i.i.d. positive random variables bounded away from zero and infinity. It is shown that ERn=nEXe−(Var (Xe)/EXe)ln n+O(1) and Var (Rn)=O(1). Moreover, we establish sub-Gaussian tail bounds for Rn. We also discuss some possible extensions to supercritical Galton–Watson trees.

Primary Subjects: 60J45
Secondary Subjects: 31C20
Keywords: Random trees; electrical networks; Efron–Stein inequality

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Links and Identifiers

Permanent link to this document: http://projecteuclid.org/euclid.aoap/1245071020
Digital Object Identifier: doi:10.1214/08-AAP572
Zentralblatt MATH identifier: 05580234

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